Abstract: Generally, the traditional Shewhart p chart has been developed by for charting the binomial data. This chart has been developed using the normal approximation with condition as low defect level and the small to moderate sample size. In real applications, however, are away from these assumptions due to skewness in the exact distribution. In this paper, a modified Exponentially Weighted Moving Average (EWMA) control chat for detecting a change in binomial data by improving square root transformations, namely ISRT p EWMA control chart. The numerical results show that ISRT p EWMA chart is superior to ISRT p chart for small to moderate shifts, otherwise, the latter is better for large shifts.
Abstract: Consider a mass production of HDD arms where
hundreds of CNC machines are used to manufacturer the HDD arms.
According to an overwhelming number of machines and models of
arm, construction of separate control chart for monitoring each HDD
arm model by each machine is not feasible. This research proposed a
strategy to optimize the SPC management on shop floor. The
procedure started from identifying the clusters of the machine with
similar manufacturing performance using clustering technique. The
three way control chart ( I - MR - R ) is then applied to each
clustered group of machine. This proposed research has
advantageous to the manufacturer in terms of not only better
performance of the SPC but also the quality management paradigm.
Abstract: The cumulative conformance count (CCC) charts are
widespread in process monitoring of high-yield manufacturing.
Recently, it is found the use of variable sampling interval (VSI)
scheme could further enhance the efficiency of the standard CCC
charts. The average time to signal (ATS) a shift in defect rate has
become traditional measure of efficiency of a chart with the VSI
scheme. Determining the ATS is frequently a difficult and tedious
task. A simple method based on a finite Markov Chain approach for
modeling the ATS is developed. In addition, numerical results are
given.
Abstract: recurrent neural network (RNN) is an efficient tool for
modeling production control process as well as modeling services. In
this paper one RNN was combined with regression model and were
employed in order to be checked whether the obtained data by the
model in comparison with actual data, are valid for variable process
control chart. Therefore, one maintenance process in workshop of
Esfahan Oil Refining Co. (EORC) was taken for illustration of
models. First, the regression was made for predicting the response
time of process based upon determined factors, and then the error
between actual and predicted response time as output and also the
same factors as input were used in RNN. Finally, according to
predicted data from combined model, it is scrutinized for test values
in statistical process control whether forecasting efficiency is
acceptable. Meanwhile, in training process of RNN, design of
experiments was set so as to optimize the RNN.
Abstract: Exponentially weighted moving average control chart (EWMA) is a popular chart used for detecting shift in the mean of parameter of distributions in quality control. The objective of this paper is to compare the efficiency of control chart to detect an increases in the mean of a process. In particular, we compared the Maximum Exponentially Weighted Moving Average (MaxEWMA) and Maximum Generally Weighted Moving Average (MaxGWMA) control charts when the observations are Exponential distribution. The criteria for evaluate the performance of control chart is called, the Average Run Length (ARL). The result of comparison show that in the case of process is small sample size, the MaxEWMA control chart is more efficiency to detect shift in the process mean than MaxGWMA control chart. For the case of large sample size, the MaxEWMA control chart is more sensitive to detect small shift in the process mean than MaxGWMA control chart, and when the process is a large shift in mean, the MaxGWMA control chart is more sensitive to detect mean shift than MaxEWMA control chart.
Abstract: In manufacturing industries, development of measurement leads to increase the number of monitoring variables and eventually the importance of multivariate control comes to the fore. Statistical process control (SPC) is one of the most widely used as multivariate control chart. Nevertheless, SPC is restricted to apply in processes because its assumption of data as following specific distribution. Unfortunately, process data are composed by the mixture of several processes and it is hard to estimate as one certain distribution. To alternative conventional SPC, therefore, nonparametric control chart come into the picture because of the strength of nonparametric control chart, the absence of parameter estimation. SVDD based control chart is one of the nonparametric control charts having the advantage of flexible control boundary. However,basic concept of SVDD has been an oversight to the important of data characteristic, density distribution. Therefore, we proposed DW-SVDD (Density Weighted SVDD) to cover up the weakness of conventional SVDD. DW-SVDD makes a new attempt to consider dense of data as introducing the notion of density Weight. We extend as control chart using new proposed SVDD and a simulation study of various distributional data is conducted to demonstrate the improvement of performance.
Abstract: In many industries, control charts is one of the most
frequently used tools for quality management. Hotelling-s T2 is used
widely in multivariate control chart. However, it has little defect when
detecting small or medium process shifts. The use of supplementary
sensitizing rules can improve the performance of detection. This study
applied sensitizing rules for Hotelling-s T2 control chart to improve the
performance of detection. Support vector machines (SVM) classifier
to identify the characteristic or group of characteristics that are
responsible for the signal and to classify the magnitude of the mean
shifts. The experimental results demonstrate that the support vector
machines (SVM) classifier can effectively identify the characteristic
or group of characteristics that caused the process mean shifts and the
magnitude of the shifts.
Abstract: In some real applications of Statistical Process Control
it is necessary to design a control chart to not detect small process
shifts, but keeping a good performance to detect moderate and large
shifts in the quality. In this work we develop a new quality control
chart, the synthetic T2 control chart, that can be designed to cope with
this objective. A multi-objective optimization is carried out employing
Genetic Algorithms, finding the Pareto-optimal front of
non-dominated solutions for this optimization problem.
Abstract: The main goal of this paper is to study Statistical Process Control (SPC) with Exponentially Weighted Moving Average (EWMA) control chart when observations are serially-correlated. The characteristic of control chart is Average Run Length (ARL) which is the average number of samples taken before an action signal is given. Ideally, an acceptable ARL of in-control process should be enough large, so-called (ARL0). Otherwise it should be small when the process is out-of-control, so-called Average of Delay Time (ARL1) or a mean of true alarm. We find explicit formulas of ARL for EWMA control chart for Seasonal Autoregressive and Moving Average processes (SARMA) with Exponential white noise. The results of ARL obtained from explicit formula and Integral equation are in good agreement. In particular, this formulas for evaluating (ARL0) and (ARL1) be able to get a set of optimal parameters which depend on smoothing parameter (λ) and width of control limit (H) for designing EWMA chart with minimum of (ARL1).
Abstract: C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for process control at this time. A cumulative sum (CUSUM) control chart is much better than a C control chart when a small shift will be detected. This study calculates one-sided CUSUM ARLs using a Markov chain approach to construct a CUSUM control chart with an underlying Poisson-Gamma compound distribution for the failure mechanism. Moreover, an actual data set from a wafer plant is used to demonstrate the operation of the proposed model. The results show that a CUSUM control chart realizes significantly better performance than EWMA.