Abstract: The cumulative conformance count (CCC) charts are
widespread in process monitoring of high-yield manufacturing.
Recently, it is found the use of variable sampling interval (VSI)
scheme could further enhance the efficiency of the standard CCC
charts. The average time to signal (ATS) a shift in defect rate has
become traditional measure of efficiency of a chart with the VSI
scheme. Determining the ATS is frequently a difficult and tedious
task. A simple method based on a finite Markov Chain approach for
modeling the ATS is developed. In addition, numerical results are
given.