Abstract: The resistive-inductive-capacitive behavior of long
interconnects which are driven by CMOS gates are presented in this
paper. The analysis is based on the ¤Ç-model of a RLC load and is
developed for submicron devices. Accurate and analytical
expressions for the output load voltage, the propagation delay and the
short circuit power dissipation have been proposed after solving a
system of differential equations which accurately describe the
behavior of the circuit. The effect of coupling capacitance between
input and output and the short circuit current on these performance
parameters are also incorporated in the proposed model. The
estimated proposed delay and short circuit power dissipation are in
very good agreement with the SPICE simulation with average
relative error less than 6%.
Abstract: To maximise furnace production it-s necessary to
optimise furnace control, with the objectives of achieving maximum
power input into the melting process, minimum network distortion
and power-off time, without compromise on quality and safety. This
can be achieved with on the one hand by an appropriate electrode
control and on the other hand by a minimum of AC transformer
switching.
Electrical arc is a stochastic process; witch is the principal cause
of power quality problems, including voltages dips, harmonic
distortion, unbalance loads and flicker. So it is difficult to make an
appropriate model for an Electrical Arc Furnace (EAF). The factors
that effect EAF operation are the melting or refining materials,
melting stage, electrode position (arc length), electrode arm control
and short circuit power of the feeder. So arc voltages, current and
power are defined as a nonlinear function of the arc length. In this
article we propose our own empirical function of the EAF and model,
for the mean stages of the melting process, thanks to the
measurements in the steel factory.