Abstract: The Requirements Abstraction Model (RAM) helps in managing abstraction in requirements by organizing them at four levels (product, feature, function and component). The RAM is adaptable and can be tailored to meet the needs of the various organizations. Because software requirements are an important source of information for developing high-level tests, organizations willing to adopt the RAM model need to know the suitability of the RAM requirements for developing high-level tests. To investigate this suitability, test cases from twenty randomly selected requirements were developed, analyzed and graded. Requirements were selected from the requirements document of a Course Management System, a web based software system that supports teachers and students in performing course related tasks. This paper describes the results of the requirements document analysis. The results show that requirements at lower levels in the RAM are suitable for developing executable tests whereas it is hard to develop from requirements at higher levels.
Abstract: In this paper test generation methods and appropriate fault models for testing and analysis of embedded systems described as (extended) finite state machines ((E)FSMs) are presented. Compared to simple FSMs, EFSMs specify not only the control flow but also the data flow. Thus, we define a two-level fault model to cover both aspects. The goal of this paper is to reuse well-known FSM-based test generation methods for automation of embedded system testing. These methods have been widely used in testing and validation of protocols and communicating systems. In particular, (E)FSMs-based specification and testing is more advantageous because (E)FSMs support the formal semantic of already standardised formal description techniques (FDTs) despite of their popularity in the design of hardware and software systems.