Adaptation of State/Transition-Based Methods for Embedded System Testing
In this paper test generation methods and appropriate fault models for testing and analysis of embedded systems described as (extended) finite state machines ((E)FSMs) are presented. Compared to simple FSMs, EFSMs specify not only the control flow but also the data flow. Thus, we define a two-level fault model to cover both aspects. The goal of this paper is to reuse well-known FSM-based test generation methods for automation of embedded system testing. These methods have been widely used in testing and validation of protocols and communicating systems. In particular, (E)FSMs-based specification and testing is more advantageous because (E)FSMs support the formal semantic of already standardised formal description techniques (FDTs) despite of their popularity in the design of hardware and software systems.
[1] Specification and Description Language SDL-92, ITU-T
Recommendation Z.100, 1992.
[2] Information processing systems - Open Systems Interconnection -
Estelle: A formal description technique based on an extended state
transition model, International Standard ISO 9074, 1989.
[3] R. Buessow, R. Geisler, and M. Klar, "Specifying safety-critical
embedded systems with statecharts and Z: A case study", In Proceedings
of Fundamental Approaches to Software Engineering (FASE-98),
Lisbon, 1998.
[4] M. Mendler, G. Luettgen. Statecharts, "From Visual Syntax to Model-
Theoretic Semantics", In K. Bauknecht, W. Brauer, and Th. M├╝ck
(editors), Workshop on Integrating Diagrammatic and Formal
Specification Techniques (IDFST 2001), pages 615-621, Vienna, 2001.
[5] B. Potter, J. Sinclair, and D. Till, "Introduction to Formal Specification
and Z (2nd Edition)", Prentice Hall PTR; 1996.
[6] A. V. Aho et al., "An optimisation technique for protocol conformance
test generation based on UIO sequences and Rural Chinese Postman
Tours", In S. Aggarwal and K. Sabnani, editors, Protocol Specification,
Testing, and Verification, New Jersey, 1988.
[7] S. Fujiwara, et al., "Test selection based on finite state models", IEEE
transaction on Software Engineering 17(6): 591-603, 1991.
[8] H. Richter et al., "A Concept For a Reliable, Cost-Effective, Real-Time
Local-Area Network for Automobiles", In Proceedings of Joint
conference Embedded in Munich and Embedded Systems, Munich,
2004.
[9] O. Henniger, A. Ulrich, and H. König, "Transformation of Estelle
modules aiming at test case derivation", Chapmann & Hall, 1995.
[10] H. Fouchal, et al., "Generation of timed automata from Estelle
specifications", In International Workshop on the Formal Technique
ESTELLE, Evry, France, 1998.
[11] A. Avizienis, J-C. Laprie, and B. Randell, "Fundamental Concepts of
Computer System Dependability", IARP/IEEE-RAS Workshop on
Robot Dependability: Technological Challenge of Dependable, Robots
in Human Environments, 2001.
[12] L. A. Corts, P. Eles, and Z. Peng, "Verification of embedded systems
using a petri net based representation", In Proceedings of the 13th
international symposium on System synthesis, Madrid, 2000.
[1] Specification and Description Language SDL-92, ITU-T
Recommendation Z.100, 1992.
[2] Information processing systems - Open Systems Interconnection -
Estelle: A formal description technique based on an extended state
transition model, International Standard ISO 9074, 1989.
[3] R. Buessow, R. Geisler, and M. Klar, "Specifying safety-critical
embedded systems with statecharts and Z: A case study", In Proceedings
of Fundamental Approaches to Software Engineering (FASE-98),
Lisbon, 1998.
[4] M. Mendler, G. Luettgen. Statecharts, "From Visual Syntax to Model-
Theoretic Semantics", In K. Bauknecht, W. Brauer, and Th. M├╝ck
(editors), Workshop on Integrating Diagrammatic and Formal
Specification Techniques (IDFST 2001), pages 615-621, Vienna, 2001.
[5] B. Potter, J. Sinclair, and D. Till, "Introduction to Formal Specification
and Z (2nd Edition)", Prentice Hall PTR; 1996.
[6] A. V. Aho et al., "An optimisation technique for protocol conformance
test generation based on UIO sequences and Rural Chinese Postman
Tours", In S. Aggarwal and K. Sabnani, editors, Protocol Specification,
Testing, and Verification, New Jersey, 1988.
[7] S. Fujiwara, et al., "Test selection based on finite state models", IEEE
transaction on Software Engineering 17(6): 591-603, 1991.
[8] H. Richter et al., "A Concept For a Reliable, Cost-Effective, Real-Time
Local-Area Network for Automobiles", In Proceedings of Joint
conference Embedded in Munich and Embedded Systems, Munich,
2004.
[9] O. Henniger, A. Ulrich, and H. König, "Transformation of Estelle
modules aiming at test case derivation", Chapmann & Hall, 1995.
[10] H. Fouchal, et al., "Generation of timed automata from Estelle
specifications", In International Workshop on the Formal Technique
ESTELLE, Evry, France, 1998.
[11] A. Avizienis, J-C. Laprie, and B. Randell, "Fundamental Concepts of
Computer System Dependability", IARP/IEEE-RAS Workshop on
Robot Dependability: Technological Challenge of Dependable, Robots
in Human Environments, 2001.
[12] L. A. Corts, P. Eles, and Z. Peng, "Verification of embedded systems
using a petri net based representation", In Proceedings of the 13th
international symposium on System synthesis, Madrid, 2000.
@article{"International Journal of Information, Control and Computer Sciences:59950", author = "Abdelaziz Guerrouat and Harald Richter", title = "Adaptation of State/Transition-Based Methods for Embedded System Testing", abstract = "In this paper test generation methods and appropriate fault models for testing and analysis of embedded systems described as (extended) finite state machines ((E)FSMs) are presented. Compared to simple FSMs, EFSMs specify not only the control flow but also the data flow. Thus, we define a two-level fault model to cover both aspects. The goal of this paper is to reuse well-known FSM-based test generation methods for automation of embedded system testing. These methods have been widely used in testing and validation of protocols and communicating systems. In particular, (E)FSMs-based specification and testing is more advantageous because (E)FSMs support the formal semantic of already standardised formal description techniques (FDTs) despite of their popularity in the design of hardware and software systems.
", keywords = "Formal methods, testing and validation, finite state machines, formal description techniques.", volume = "1", number = "10", pages = "3214-7", }
