Abstract: The presence of harmonic in power system is a major
concerned to power engineers for many years. With the increasing
usage of nonlinear loads in power systems, the harmonic pollution
becomes more serious. One of the widely used computation
algorithm for harmonic analysis is fast Fourier transform (FFT). In
this paper, a harmonic analyzer using FFT was implemented on
TMS320C6713 DSK. The supply voltage of 240 V 59 Hz is stepped
down to 5V using a voltage divider in order to match the power
rating of the DSK input. The output from the DSK was displayed on
oscilloscope and Code Composer Studio™ software. This work has
demonstrated the possibility of analyzing the 240V power supply
harmonic content using the DSK board.
Abstract: An efficient parallel form in digital signal processor can improve the algorithm performance. The butterfly structure is an important role in fast Fourier transform (FFT), because its symmetry form is suitable for hardware implementation. Although it can perform a symmetric structure, the performance will be reduced under the data-dependent flow characteristic. Even though recent research which call as novel memory reference reduction methods (NMRRM) for FFT focus on reduce memory reference in twiddle factor, the data-dependent property still exists. In this paper, we propose a parallel-computing approach for FFT implementation on digital signal processor (DSP) which is based on data-independent property and still hold the property of low-memory reference. The proposed method combines final two steps in NMRRM FFT to perform a novel data-independent structure, besides it is very suitable for multi-operation-unit digital signal processor and dual-core system. We have applied the proposed method of radix-2 FFT algorithm in low memory reference on TI TMSC320C64x DSP. Experimental results show the method can reduce 33.8% clock cycles comparing with the NMRRM FFT implementation and keep the low-memory reference property.
Abstract: The morphological parameter of a thin film surface
can be characterized by power spectral density (PSD) functions
which provides a better description to the topography than the RMS
roughness and imparts several useful information of the surface
including fractal and superstructure contributions. Through the
present study Nanoparticle copper/carbon composite films were
prepared by co-deposition of RF-Sputtering and RF-PECVD method
from acetylene gas and copper target. Surface morphology of thin
films is characterized by using atomic force microscopy (AFM). The
Carbon content of our films was obtained by Rutherford Back
Scattering (RBS) and it varied from .4% to 78%. The power values of
power spectral density (PSD) for the AFM data were determined by
the fast Fourier transform (FFT) algorithms. We investigate the effect
of carbon on the roughness of thin films surface. Using such
information, roughness contributions of the surface have been
successfully extracted.