Abstract: Electromagnetic Interference (EMI) shielded doors made from brass extruded channels need to be welded with shielded enclosures to attain optimum shielding performance. Control of welding induced distortion is a problem in welding dissimilar metals like steel and brass. In this research, soldering of the steel-brass joint has been proposed to avoid weld distortion. The material used for brass channel is UNS C36000. The thickness of brass is defined by the manufacturing process, i.e. extrusion. The thickness of shielded enclosure material (ASTM A36) can be varied to produce joint between the dissimilar metals. Steel sections of different gauges are soldered using (91% tin, 9% zinc) solder to the brass, and strength of joint is measured by standard test procedures. It is observed that thin steel sheets produce a stronger bond with brass. The steel sections further require to be welded with shielded enclosure steel sheets through TIG welding process. Stresses and deformation in the vicinity of soldered portion is calculated through FE simulation. Crack formation in soldered area is also studied through experimental work. It has been found that in thin sheets deformation produced due to applied force is localized and has no effect on soldered joint area whereas in thick sheets profound cracks have been observed in soldered joint. The shielding effectiveness of EMI shielded door is compromised due to these cracks. The shielding effectiveness of the specimens is tested and results are compared.
Abstract: The field of instrumentation electronics is undergoing
an explosive growth, due to its wide range of applications. The
proliferation of electrical devices in a close working proximity can
negatively influence each other’s performance. The degradation in
the performance is due to electromagnetic interference (EMI). This paper investigates the negative effects of electromagnetic
interference originating in the General Purpose Interface Bus (GPIB)
control-network of the AC-DC transfer measurement system.
Remedial measures of reducing measurement errors and failure of
range of industrial devices due to EMI have been explored. The ACDC
transfer measurement system was analysed for the commonmode
(CM) EMI effects. Further investigation of coupling path as
well as much accurate identification of noise propagation mechanism
has been outlined. To prevent the occurrence of common-mode
(ground loops) which was identified between the GPIB system
control circuit and the measurement circuit, a microcontroller-driven
GPIB switching isolator device was designed, prototyped,
programmed and validated. This mitigation technique has been
explored to reduce EMI effectively.
Abstract: Electromagnetic interference (EMI) is one of the
serious problems in most electrical and electronic appliances
including fluorescent lamps. The electronic ballast used to regulate
the power flow through the lamp is the major cause for EMI. The
interference is because of the high frequency switching operation of
the ballast. Formerly, some EMI mitigation techniques were in
practice, but they were not satisfactory because of the hardware
complexity in the circuit design, increased parasitic components and
power consumption and so on. The majority of the researchers have
their spotlight only on EMI mitigation without considering the other
constraints such as cost, effective operation of the equipment etc. In
this paper, we propose a technique for EMI mitigation in fluorescent
lamps by integrating Frequency Modulation and Evolutionary
Programming. By the Frequency Modulation technique, the
switching at a single central frequency is extended to a range of
frequencies, and so, the power is distributed throughout the range of
frequencies leading to EMI mitigation. But in order to meet the
operating frequency of the ballast and the operating power of the
fluorescent lamps, an optimal modulation index is necessary for
Frequency Modulation. The optimal modulation index is determined
using Evolutionary Programming. Thereby, the proposed technique
mitigates the EMI to a satisfactory level without disturbing the
operation of the fluorescent lamp.