Abstract: The selective wet-etching of amorphous and
crystalline region of Sb20Se80 thin films was carried out using organic
based solution e.g. amines. We report the development of an in situ
real-time method to study the wet chemical etching process of thin
films. Characterization of the structure and surface of films studied
by X-ray diffraction, SEM and EBSD methods has been done and
potential application suggested.