Abstract: We have fabricated a-IGZO TFT and investigated the
stability under positive DC and AC bias stress. The threshold voltage
of a-IGZO TFT shifts positively under those biases, and that reduces
on-current. For this reason, conventional shift-register circuit
employing TFTs which stressed by positive bias will be unstable, may
do not work properly. We have designed a new 6-transistor
shift-register, which has less transistors than prior circuits. The TFTs
of the proposed shift-register are not suffering from positive DC or AC
stress, mainly kept unbiased. Despite the compact design, the stable
output signal was verified through the SPICE simulation even under
RC delay of clock signal.