Abstract: In this paper genetic based test data compression is
targeted for improving the compression ratio and for reducing the
computation time. The genetic algorithm is based on extended pattern
run-length coding. The test set contains a large number of X value
that can be effectively exploited to improve the test data
compression. In this coding method, a reference pattern is set and its
compatibility is checked. For this process, a genetic algorithm is
proposed to reduce the computation time of encoding algorithm. This
coding technique encodes the 2n compatible pattern or the inversely
compatible pattern into a single test data segment or multiple test data
segment. The experimental result shows that the compression ratio
and computation time is reduced.