Error Detection and Correction for Onboard Satellite Computers Using Hamming Code

In an attempt to enrich the lives of billions of people by providing proper information, security and a way of communicating with others, the need for efficient and improved satellites is constantly growing. Thus, there is an increasing demand for better error detection and correction (EDAC) schemes, which are capable of protecting the data onboard the satellites. The paper is aimed towards detecting and correcting such errors using a special algorithm called the Hamming Code, which uses the concept of parity and parity bits to prevent single-bit errors onboard a satellite in Low Earth Orbit. This paper focuses on the study of Low Earth Orbit satellites and the process of generating the Hamming Code matrix to be used for EDAC using computer programs. The most effective version of Hamming Code generated was the Hamming (16, 11, 4) version using MATLAB, and the paper compares this particular scheme with other EDAC mechanisms, including other versions of Hamming Codes and Cyclic Redundancy Check (CRC), and the limitations of this scheme. This particular version of the Hamming Code guarantees single-bit error corrections as well as double-bit error detections. Furthermore, this version of Hamming Code has proved to be fast with a checking time of 5.669 nanoseconds, that has a relatively higher code rate and lower bit overhead compared to the other versions and can detect a greater percentage of errors per length of code than other EDAC schemes with similar capabilities. In conclusion, with the proper implementation of the system, it is quite possible to ensure a relatively uncorrupted satellite storage system.

A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1

This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors.