Abstract: In this paper, a frequency-variation based method has
been proposed for transistor parameter estimation in a commonemitter
transistor amplifier circuit. We design an algorithm to estimate
the transistor parameters, based on noisy measurements of the output
voltage when the input voltage is a sine wave of variable frequency
and constant amplitude. The common emitter amplifier circuit has
been modelled using the transistor Ebers-Moll equations and the
perturbation technique has been used for separating the linear and
nonlinear parts of the Ebers-Moll equations. This model of the amplifier
has been used to determine the amplitude of the output sinusoid as
a function of the frequency and the parameter vector. Then, applying
the proposed method to the frequency components, the transistor
parameters have been estimated. As compared to the conventional
time-domain least squares method, the proposed method requires
much less data storage and it results in more accurate parameter
estimation, as it exploits the information in the time and frequency
domain, simultaneously. The proposed method can be utilized for
parameter estimation of an analog device in its operating range of
frequencies, as it uses data collected from different frequencies output
signals for parameter estimation.