Round Addition Differential Fault Analysis on Lightweight Block Ciphers with On-the-Fly Key Scheduling

Round addition differential fault analysis using operation skipping for lightweight block ciphers with on-the-fly key scheduling is presented. For 64-bit KLEIN, it is shown that only a pair of correct and faulty ciphertexts can be used to derive the secret master key. For PRESENT, one correct ciphertext and two faulty ciphertexts are required to reconstruct the secret key. Furthermore, secret key extraction is demonstrated for the LBlock Feistel-type lightweight block cipher.

A Fault Analysis Cracked-Rotor-to-Stator Rub and Unbalance by Vibration Analysis Technique

An analytical 4-DOF nonlinear model of a de Laval rotor-stator system based on Energy Principles has been used theoretically and experimentally to investigate fault symptoms in a rotating system. The faults, namely rotor-stator-rub, crack and unbalance are modeled as excitations on the rotor shaft. Mayes steering function is used to simulate the breathing behaviour of the crack. The fault analysis technique is based on waveform signal, orbits and Fast Fourier Transform (FFT) derived from simulated and real measured signals. Simulated and experimental results manifest considerable mutual resemblance of elliptic-shaped orbits and FFT for a same range of test data.

A New Performance Characterization of Transient Analysis Method

This paper proposes a new performance characterization for the test strategy intended for second order filters denominated Transient Analysis Method (TRAM). We evaluate the ability of the addressed test strategy for detecting deviation faults under simultaneous statistical fluctuation of the non-faulty parameters. For this purpose, we use Monte Carlo simulations and a fault model that considers as faulty only one component of the filter under test while the others components adopt random values (within their tolerance band) obtained from their statistical distributions. The new data reported here show (for the filters under study) the presence of hard-to-test components and relatively low fault coverage values for small deviation faults. These results suggest that the fault coverage value obtained using only nominal values for the non-faulty components (the traditional evaluation of TRAM) seem to be a poor predictor of the test performance.