Abstract: The paper focuses on the problem of the point
correspondence matching in stereo images. The proposed matching
algorithm is based on the combination of simpler methods such as
normalized sum of squared differences (NSSD) and a more complex
phase correlation based approach, by considering the noise and other
factors, as well. The speed of NSSD and the preciseness of the
phase correlation together yield an efficient approach to find the best
candidate point with sub-pixel accuracy in stereo image pairs. The
task of the NSSD in this case is to approach the candidate pixel
roughly. Afterwards the location of the candidate is refined by an
enhanced phase correlation based method which in contrast to the
NSSD has to run only once for each selected pixel.
Abstract: This article presents a computationally tractable probabilistic model for the relation between the complex wavelet coefficients of two images of the same scene. The two images are acquisitioned at distinct moments of times, or from distinct viewpoints, or by distinct sensors. By means of the introduced probabilistic model, we argue that the similarity between the two images is controlled not by the values of the wavelet coefficients, which can be altered by many factors, but by the nature of the wavelet coefficients, that we model with the help of hidden state variables. We integrate this probabilistic framework in the construction of a new image registration algorithm. This algorithm has sub-pixel accuracy and is robust to noise and to other variations like local illumination changes. We present the performance of our algorithm on various image types.
Abstract: This paper presents a useful sub-pixel image
registration method using line segments and a sub-pixel edge detector.
In this approach, straight line segments are first extracted from gray
images at the pixel level before applying the sub-pixel edge detector.
Next, all sub-pixel line edges are mapped onto the orientation-distance
parameter space to solve for line correspondence between images.
Finally, the registration parameters with sub-pixel accuracy are
analytically solved via two linear least-square problems. The present
approach can be applied to various fields where fast registration with
sub-pixel accuracy is required. To illustrate, the present approach is
applied to the inspection of printed circuits on a flat panel. Numerical
example shows that the present approach is effective and accurate
when target images contain a sufficient number of line segments,
which is true in many industrial problems.