Abstract: Post growth annealing of solution grown ZnO
nanowire array is performed under controlled oxygen ambience. The
role of annealing over surface defects and their consequence on
dark/photo-conductivity and photosensitivity of nanowire array is
investigated. Surface defect properties are explored using various
measurement tools such as contact angle, photoluminescence, Raman
spectroscopy and XPS measurements. The contact angle of the NW
films reduces due to oxygen annealing and nanowire film surface
changes from hydrophobic (96°) to hydrophilic (16°). Raman and
XPS spectroscopy reveal that oxygen annealing improves the crystal
quality of the nanowire films. The defect band emission intensity
(relative to band edge emission, ID/IUV) reduces from 1.3 to 0.2 after
annealing at 600 °C at 10 SCCM flow of oxygen. An order
enhancement in dark conductivity is observed in O2 annealed
samples, while photoconductivity is found to be slightly reduced due
to lower concentration of surface related oxygen defects.