Abstract: This paper presents a useful sub-pixel image
registration method using line segments and a sub-pixel edge detector.
In this approach, straight line segments are first extracted from gray
images at the pixel level before applying the sub-pixel edge detector.
Next, all sub-pixel line edges are mapped onto the orientation-distance
parameter space to solve for line correspondence between images.
Finally, the registration parameters with sub-pixel accuracy are
analytically solved via two linear least-square problems. The present
approach can be applied to various fields where fast registration with
sub-pixel accuracy is required. To illustrate, the present approach is
applied to the inspection of printed circuits on a flat panel. Numerical
example shows that the present approach is effective and accurate
when target images contain a sufficient number of line segments,
which is true in many industrial problems.
Abstract: Nowadays, hard disk is one of the most popular storage components. In hard disk industry, the hard disk drive must pass various complex processes and tested systems. In each step, there are some failures. To reduce waste from these failures, we must find the root cause of those failures. Conventionall data analysis method is not effective enough to analyze the large capacity of data. In this paper, we proposed the Hough method for straight line detection that helps to detect straight line defect patterns that occurs in hard disk drive. The proposed method will help to increase more speed and accuracy in failure analysis.
Abstract: In this article, a method has been offered to classify
normal and defective tiles using wavelet transform and artificial
neural networks. The proposed algorithm calculates max and min
medians as well as the standard deviation and average of detail
images obtained from wavelet filters, then comes by feature vectors
and attempts to classify the given tile using a Perceptron neural
network with a single hidden layer. In this study along with the
proposal of using median of optimum points as the basic feature and
its comparison with the rest of the statistical features in the wavelet
field, the relational advantages of Haar wavelet is investigated. This
method has been experimented on a number of various tile designs
and in average, it has been valid for over 90% of the cases. Amongst
the other advantages, high speed and low calculating load are
prominent.