Instrumentation for Studying Real-time Popcorn Effect in Surface Mount Packages during Solder Reflow

Occurrence of popcorn in IC packages while assembling them onto the PCB is a well known moisture sensitive reliability issues, especially for surface mount packages. Commonly reflow soldering simulation process is conducted to assess the impact of assembling IC package onto PCB. A strain gauge-based instrumentation is developed to investigate the popcorn effect in surface mount packages during reflow soldering process. The instrument is capable of providing real-time quantitative information of the occurrence popcorn phenomenon in IC packages. It is found that the popcorn occur temperatures between 218 to 241°C depending on moisture soak condition, but not at the peak temperature of the reflow process. The presence of popcorn and delamination are further confirmed by scanning acoustic tomography as a failure analysis.


Authors:



References:
[1] I. Fukuzawa, S. Ishiguro, S. Nabu Young, "Moisture resistance degradation of plastic LSI’s by reflow soldering”, in Proc. IEEE Anuu. Int. Relia. Phys. Symp., 1985, pp. 192197.
[2] T. C. Chai, K. L. Chan, E. H. Wong, X. J. Fan, T. B. Lim, "Achieving crack free package through elimination of type II failure”, in Proc. 49th IEEE ECTC, 1999, pp. 702707.
[3] P. Alpern, R. Dudek, R. Schmidt, V. Wicher, R. Tilgner, "On the mode II popcorn effect in thin packages”, IEEE Trans. Comp. Pack. Technol., vol. 25(1), pp. 5665, 2002.
[4] P. Alpern, K.C. Lee, R. Dudek, R. Tilgner, "A simple model for the mode I popcorn effect for IC packages with copper leadframe”, IEEE Trans. Comp. Pack. Technol., vol. 25(2), pp. 301308, 2002.
[5] X. Cai, W. Huang, B. Xu, G. Kaltenpoth, Z. Cheng, "A study of moisture diffusion in plastic packaging”, J. Electronic Mat., vol. 31(5), pp. 449455, 2002.
[6] M. Kitano, A. Nishimura, R. Kohno, "Development of damage detection system for surface mount packages during reflow soldering”, in Proc. IEEE, 1991, pp. 615620.
[7] J. Lau, R. Chen, C. Chang, "Real-time popcorn analysis of plastic ball grid arrya packages during solder reflow”, in Proc. IEEE CPMT Int’l Elect. Manufac. Technol. Symp., 1998, pp. 455463.
[8] H. J. Moon, T.G. Chung, H. Lee, E.C. Ahn, T.J. Cho, S.Y. Oh, "Experimental stress analysis for flip chip BGA packages using strain gauge”, in Proc. IEEE, 1999, pp. 510513.