Model-Based Software Regression Test Suite Reduction

In this paper, we present a model-based regression test suite reducing approach that uses EFSM model dependence analysis and probability-driven greedy algorithm to reduce software regression test suites. The approach automatically identifies the difference between the original model and the modified model as a set of elementary model modifications. The EFSM dependence analysis is performed for each elementary modification to reduce the regression test suite, and then the probability-driven greedy algorithm is adopted to select the minimum set of test cases from the reduced regression test suite that cover all interaction patterns. Our initial experience shows that the approach may significantly reduce the size of regression test suites.

Authors:

• Shiwei Deng
• Yang Bao

Keywords:

• Dependence analysis
• EFSM model
• greedy algorithm
• regression test.

References:

[1] E. Engström, P. Runeson, M. Skoglund, “A systematic review on
regression test selection techniques,” Information and Software
Technology, vol.52, no.1, 2010, pp.14-30.
[2] M. Salehie, S. Li, L. Tahvildari, R. Dara, S. Li, M. Moore, “Prioritizing
Requirements-Based Regression Test Cases: A Goal-Driven Practice,” in
Proc. 15th European Conference on Software Maintenance and
Reengineering, Lisbon, Portugal, 2011, pp.329-332.
[3] R. P. Gorthi, A. Pasala, K. K. Chanduka and B. Leong,
“Specification-based approach to select regression test suite to validate
changed software,” in Proc.15th Asia-Pacific Software Engineering
Conference, Beijing, China, 2008, pp.153-160.
[4] B. Korel, L. H. Tahat, B. Vaysburg, “Model based regression test
reduction using dependence analysis,” in Proc. International Conference
on Software Maintenance (ICSM2002), Montreal, Canada, 2002, pp.
214-223.
[5] B. Xie, Requirement-based Regression Test Suite Reduction Use
Dependence Analysis, Master’s thesis, University of Ottawa, Canada,
2005.
[6] S. Rampone, “Probability-driven Greedy Algorithms for Set Cover,” in
Proc. VIII SIGEF Congress "New Logics for the New Economy", Naples,
Italy, 2001, pp. 215-220.
[7] Y. Chen, Specification-based Regression Test Suite Generation and
Reduction, Ph.D. thesis, University of Ottawa, Canada, 2009.