Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through AFM, in order to provide them with better understanding of the physical properties of the surface, such as roughness, stiffness and shape of molecular architecture. At this stage, the proposed work uses of ine images produced using AFM and perform image analysis to create virtual surfaces suitable for haptics force analysis. The research work is in the process of extension from of ine to online process where interaction will be done directly on the material surface for realistic analysis.
[1] D. Schaefer, R. Reifenberger, A. Patil and R. Andres, Fabrication of
two dimensional arrays od nanometer-size clusters with the atomic force
microscope Appl. Phys. Letters 66: 1012-1014, 1995.
[2] T. Junno, K. Deppert, L. Montellius and L. Samuelson, Controlled
manipulation of nanoparticles with an atomic force microscope Phys.
Rev. Letters 66(26): 3627-3629, 1995.
[3] L. Hansen, A. Kuhle, A. Sorensen, J. Bohr and P. Lindelof, A technique
for positioning nano-particles using an atomic force microscope
Nanotechnology 9: 337-342, 1998.
[4] G. Binning, C. Quate, and C. Gerber, Atomic Force Microscope Phys.
Rev. Letters 56(9): 930-933, 1986.
[5] A. Ferreira and C. Mavroidis, Virtual Reality and Haptics for Nano
Robotics: A Review Study IEEE Robotics and Automation Magzine,
2006.
[6] G. Varadhan, W. Robinett, D. Erie and R. Taylor, Fast simulation of
atomic force microscope imaging a polygonal surfaces using graphics
hardware, 2004
[7] L. Fok, Y. Liu and W. Li, Haptic Sensing and Modeling of Nanomanipulation
with an AFM, IEEE International Conference on Robotics and
Biomimetics, 2004
[8] M. Corno and M. Zefran, Haptic Playback: Modeling, Controller
Design, and Stability Analysis Proceedings of Robotics: Science and
Systems, 2006
[9] E, Saddik, The Potential of Haptics Technologies, Instrumentation and
Measurement Magazine 10(1): 10-17, 2007
[10] B. Nelson, Y. Zhpu and B. Vikramaditya, Sensor based microassembly
of Hybrid MEMS devices IEEE Control systems, 1998
[11] M. Tortonese, H. Yamada, C. Berrett and F. Quate, Artomic force
microscopy using a piezoresistive cantilever Int. conf. on Solid State
Sensors and Actuators, 1991
[12] L. Fok, Y. Liu and W. Li, Modeling of Haptic Sensing of Nanolithography
with an Atomic Force Microscope International Conference on
Robotics and Automation, 2005
[13] G. Li, N. Xi, M. Yu, W. Fung, Development of Augmented Reality
System for AFM-Based Nanomanipulation, IEEE ASME Transections
on Mechatronics 9(2): 358-365, 2004
[14] G. Binning, C. Quate and C. Gerber, Atomic force microscope Phys.
Rev. Lett., 56(9): 930933, 1986
[15] D. Schaefer, R. Reifenberger, A. Patil and R. Andres, Fabrication of
two-dimensional arrays of nanometer-size clusters with the atomic force
microscope, Appl. Phys. Lett., 66: 10121014, 1995.
[16] T. Junno, K. Deppert, L. Montelius, and L. Samuelson, Controlled
manipulation of nanoparticles with an atomic force microscope Appl.
Phys. Lett., 66(26): 36273629, 1995.
[17] A. Requicha, C. Baur, A. Bugacov, B. Gazen, B. Koel, A. Madhukar,
T. Ramachandran, R. Resch, and P. Will, Nanorobotic assembly of
two-dimensional structures, in Proc. IEEE Int. Conf. Robotics and
Automation, p. 33683374. 1998,
[18] L. Hansen, A. Kuhle, A. Sorensen, J. Bohr, and P. Lindelof, A technique
for positioning nanoparticles using an atomic force microscope,
Nanotechnology, 9:337342, 1998.
[19] M. Asghar, and K. Barner, Nonlinear Multiresolution Techniques with
Applications to Scientific Visualization in a Haptic Environment, IEEE
TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS
7(1): 76-93, 2001
[1] D. Schaefer, R. Reifenberger, A. Patil and R. Andres, Fabrication of
two dimensional arrays od nanometer-size clusters with the atomic force
microscope Appl. Phys. Letters 66: 1012-1014, 1995.
[2] T. Junno, K. Deppert, L. Montellius and L. Samuelson, Controlled
manipulation of nanoparticles with an atomic force microscope Phys.
Rev. Letters 66(26): 3627-3629, 1995.
[3] L. Hansen, A. Kuhle, A. Sorensen, J. Bohr and P. Lindelof, A technique
for positioning nano-particles using an atomic force microscope
Nanotechnology 9: 337-342, 1998.
[4] G. Binning, C. Quate, and C. Gerber, Atomic Force Microscope Phys.
Rev. Letters 56(9): 930-933, 1986.
[5] A. Ferreira and C. Mavroidis, Virtual Reality and Haptics for Nano
Robotics: A Review Study IEEE Robotics and Automation Magzine,
2006.
[6] G. Varadhan, W. Robinett, D. Erie and R. Taylor, Fast simulation of
atomic force microscope imaging a polygonal surfaces using graphics
hardware, 2004
[7] L. Fok, Y. Liu and W. Li, Haptic Sensing and Modeling of Nanomanipulation
with an AFM, IEEE International Conference on Robotics and
Biomimetics, 2004
[8] M. Corno and M. Zefran, Haptic Playback: Modeling, Controller
Design, and Stability Analysis Proceedings of Robotics: Science and
Systems, 2006
[9] E, Saddik, The Potential of Haptics Technologies, Instrumentation and
Measurement Magazine 10(1): 10-17, 2007
[10] B. Nelson, Y. Zhpu and B. Vikramaditya, Sensor based microassembly
of Hybrid MEMS devices IEEE Control systems, 1998
[11] M. Tortonese, H. Yamada, C. Berrett and F. Quate, Artomic force
microscopy using a piezoresistive cantilever Int. conf. on Solid State
Sensors and Actuators, 1991
[12] L. Fok, Y. Liu and W. Li, Modeling of Haptic Sensing of Nanolithography
with an Atomic Force Microscope International Conference on
Robotics and Automation, 2005
[13] G. Li, N. Xi, M. Yu, W. Fung, Development of Augmented Reality
System for AFM-Based Nanomanipulation, IEEE ASME Transections
on Mechatronics 9(2): 358-365, 2004
[14] G. Binning, C. Quate and C. Gerber, Atomic force microscope Phys.
Rev. Lett., 56(9): 930933, 1986
[15] D. Schaefer, R. Reifenberger, A. Patil and R. Andres, Fabrication of
two-dimensional arrays of nanometer-size clusters with the atomic force
microscope, Appl. Phys. Lett., 66: 10121014, 1995.
[16] T. Junno, K. Deppert, L. Montelius, and L. Samuelson, Controlled
manipulation of nanoparticles with an atomic force microscope Appl.
Phys. Lett., 66(26): 36273629, 1995.
[17] A. Requicha, C. Baur, A. Bugacov, B. Gazen, B. Koel, A. Madhukar,
T. Ramachandran, R. Resch, and P. Will, Nanorobotic assembly of
two-dimensional structures, in Proc. IEEE Int. Conf. Robotics and
Automation, p. 33683374. 1998,
[18] L. Hansen, A. Kuhle, A. Sorensen, J. Bohr, and P. Lindelof, A technique
for positioning nanoparticles using an atomic force microscope,
Nanotechnology, 9:337342, 1998.
[19] M. Asghar, and K. Barner, Nonlinear Multiresolution Techniques with
Applications to Scientific Visualization in a Haptic Environment, IEEE
TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS
7(1): 76-93, 2001
@article{"International Journal of Information, Control and Computer Sciences:54700", author = "Bhatti A. and Nahavandi S. and Hossny M.", title = "Haptics Enabled of ine AFM Image Analysis", abstract = "Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through AFM, in order to provide them with better understanding of the physical properties of the surface, such as roughness, stiffness and shape of molecular architecture. At this stage, the proposed work uses of ine images produced using AFM and perform image analysis to create virtual surfaces suitable for haptics force analysis. The research work is in the process of extension from of ine to online process where interaction will be done directly on the material surface for realistic analysis.
", keywords = "Haptics, AFM, force feedback, image analysis.", volume = "4", number = "8", pages = "1249-6", }
