Card image

Scholarly

Volume:5, Issue: 12, 2011 Page No: 2594 - 2597

International Journal of Mechanical, Industrial and Aerospace Sciences

ISSN: 2517-9950

1766 Downloads
Abstract Full Text Download References Share Add to Favorites
DOI:10.5281/zenodo.1058409 BibTeX JSON

Development of a RAM Simulation Model for Acid Gas Removal System

A reliability, availability and maintainability (RAM) model has been built for acid gas removal plant for system analysis that will play an important role in any process modifications, if required, for achieving its optimum performance. Due to the complexity of the plant, the model was based on a Reliability Block Diagram (RBD) with a Monte Carlo simulation engine. The model has been validated against actual plant data as well as local expert opinions, resulting in an acceptable simulation model. The results from the model showed that the operation and maintenance can be further improved, resulting in reduction of the annual production loss.

Authors:
Keywords:
References:
[1] ¶ÇÇ▒¶ÇÇæ¶ÇÇâ¶ÇÇñ¶ÇüضÇüɶÇüî¶ÇÇŶÇÇâ¶Çǽ¶ÇÇæ¶ÇÇâ¶ÇÇ░¶Çüÿ¶ÇüĶÇüï¶Çüù¶Çüä¶Çüò¶ÇÇâ¶Çüä¶Çüæ¶Çüç¶ÇÇâ¶ÇÇ«¶ÇÇæ¶ÇÇ░¶ÇÇæ¶ÇÇâ¶ÇǶÇüä¶Çüà¶Çüî¶ÇüŶÇÇŶÇÇâ¶Çé│¶ÇÇÁ¶Çüê¶ÇüɶÇüƶÇüÖ¶Çüä¶ÇüŶÇÇâ¶ÇüƶÇüë¶ÇÇâ¶Çüï¶Çüî¶Çüè¶Çüï¶ÇÇâ¶ÇǪ¶ÇÇ▓2 content in
natural gas by formation of gas hydrates as a potential solution for CO2
¶Çüè¶Çüä¶Çüû¶ÇÇâ¶Çüê¶ÇüɶÇüî¶Çüû¶Çüû¶Çüî¶ÇüƶÇüæ¶ÇÇŶÇé┤¶ÇÇâ¶ÇÇâ
http://eprints.utp.edu.my/5250/1/FULL_PAPER_ICENV10_ref_updated
.pdf [31 July, 2011].
[2] ¶ÇÇ░¶ÇÇæ¶ÇÇñ¶ÇÇæ¶ÇÇâ¶ÇÇñ¶Çüò¶Çüî¶Çüë¶Çüî¶Çüæ¶ÇÇŶÇÇâ¶Çé│¶ÇÇ¿¶Çüø¶Çüô¶Çüê¶Çüò¶Çüî¶ÇüɶÇüê¶Çüæ¶Çüù¶Çüä¶ÇüŶÇÇâ¶Çüû¶Çüù¶Çüÿ¶Çüç¶Çü£¶ÇÇâ¶ÇüƶÇüæ¶ÇÇâ¶Çüä¶Çüå¶Çüî¶Çüç¶ÇÇâ¶Çüè¶Çüä¶Çüû¶ÇÇâ¶Çüò¶Çüê¶ÇüɶÇüƶÇüÖ¶Çüä¶ÇüŶÇÇâ¶Çüÿ¶Çüû¶Çüî¶Çüæ¶Çüè¶ÇÇâ¶Çüä¶Çüà¶Çüû¶ÇüƶÇüò¶Çüô¶Çüù¶Çüî¶ÇüƶÇüæ-
¶Çüä¶Çüç¶Çüû¶ÇüƶÇüò¶Çüô¶Çüù¶Çüî¶ÇüƶÇüæ¶ÇÇâ¶Çüÿ¶Çüæ¶Çüî¶Çüù¶ÇÇŶÇé┤¶ÇÇâ¶ÇÇ®¶Çüî¶Çüæ¶Çüä¶ÇüŶÇÇâ¶ÇÇ╝¶Çüê¶Çüä¶Çüò¶ÇÇâ¶ÇÇ│¶Çüò¶ÇüƶÇüì¶Çüê¶Çüå¶Çüù¶ÇÇâ¶Çüù¶Çüï¶Çüê¶Çüû¶Çüî¶Çüû¶ÇÇŶÇÇâ¶ÇÇ©¶Çüæ¶Çüî¶ÇüÖ¶Çüê¶Çüò¶Çüû¶Çüî¶Çüù¶Çüî¶ÇÇâ¶ÇÇ░¶Çüä¶ÇüŶÇüä¶Çü£¶Çüû¶Çüî¶Çüä¶ÇÇâ¶ÇÇ│¶Çüä¶Çüï¶Çüä¶Çüæ¶Çüè¶ÇÇŶÇÇâ
Malaysia, April 2009.
[3] J. Thras¶Çüï¶Çüê¶Çüò¶ÇÇŶÇÇâ ¶Çüä¶Çüæ¶Çüç¶ÇÇâ ¶ÇÇñ¶ÇÇæ¶ÇÇ¡¶ÇÇæ¶ÇÇâ ¶ÇÇ®¶ÇüŶÇüê¶Çüê¶Çüù¶ÇÇŶÇÇâ ¶Çé│¶ÇÇ│¶Çüò¶Çüê¶Çüç¶Çüî¶Çüå¶Çüù¶Çüî¶Çüæ¶Çüè¶ÇÇâ ¶Çüù¶Çüï¶Çüê¶ÇÇâ ¶ÇÇÁ¶Çüî¶Çüû¶ÇüĶÇÇâ ¶ÇüƶÇüë¶ÇÇâ ¶ÇǪ¶Çüä¶Çüò¶Çüà¶ÇüƶÇüæ¶ÇÇâ ¶ÇǺ¶Çüî¶ÇüƶÇüø¶Çüî¶Çüç¶Çüê¶ÇÇâ
¶ÇÇè¶ÇÇ│¶ÇüƶÇüŶÇüŶÇüÿ¶Çüù¶Çüî¶ÇüƶÇüæ¶ÇÇè¶ÇÇâ¶Çüî¶Çüæ¶ÇÇâ¶ÇÇ│¶Çüê¶Çüù¶Çüò¶ÇüƶÇüŶÇüê¶Çüÿ¶ÇüɶÇÇâ¶ÇÇÁ¶Çüê¶Çüû¶Çüê¶Çüò¶ÇüÖ¶ÇüƶÇüî¶Çüò¶Çüû¶ÇÇŶÇé┤¶ÇÇâ¶ÇÇ¡¶ÇÇæ¶ÇÇâ¶ÇÇ▓¶ÇÇæ¶ÇÇâ¶ÇǬ¶Çüò¶Çüî¶ÇüɶÇüä¶ÇüŶÇüù¶ÇÇŶÇÇâ¶Çüä¶Çüæ¶Çüç¶ÇÇâ¶ÇǪ¶ÇÇæ¶ÇÇâ¶ÇǺ¶ÇüƶÇüò¶Çüò¶ÇüƶÇüæ¶Çüû¶ÇüƶÇüò¶ÇüƶÇÇŶÇÇâ
eds., Organic Geochemistry: Developments and Applications to Energy,
Climate, Environment and Human History - Selected papers from the
17th International Meeting on Organic Geochemistry, San Sebastian,
AIGOA, pp. 1086-1088, 1995.
[4] ¶ÇÇ«¶ÇÇæ¶ÇÇ░¶ÇÇæ¶ÇÇâ¶ÇǶÇüä¶Çüà¶Çüî¶ÇüŶÇÇŶÇÇâ¶ÇǬ¶ÇÇæ¶ÇÇ¡¶ÇÇæ¶ÇÇâ¶ÇÇ║¶Çüî¶Çüù¶ÇüĶÇüä¶ÇüɶÇüô¶ÇÇâ¶Çüä¶Çüæ¶Çüç¶ÇÇâ¶ÇǪ¶ÇÇæ¶ÇÇ¡¶ÇÇæ¶ÇÇâ¶ÇÇ│¶Çüê¶Çüù¶Çüê¶Çüò¶Çüû¶ÇÇŶÇÇâ¶Çé│¶ÇÇ│¶Çüï¶Çüä¶Çüû¶Çüê¶ÇÇâ¶ÇÇ¿¶Çüö¶Çüÿ¶Çüî¶ÇüŶÇüî¶Çüà¶Çüò¶Çüî¶Çüä¶ÇÇâ¶Çüî¶Çüæ¶ÇÇâ¶ÇÇÀ¶Çüê¶Çüò¶Çüæ¶Çüä¶Çüò¶Çü£¶ÇÇâ
(Carbon Dioxide + Tetrahydrofuran + Water) System in Hydrate-
Forming Region: Effects of Carbon Dioxide Concentration and the
Occurrence of Pseudo-¶ÇÇÁ¶Çüê¶Çüù¶Çüò¶ÇüƶÇüè¶Çüò¶Çüä¶Çüç¶Çüê¶ÇÇâ ¶Çǽ¶Çü£¶Çüç¶Çüò¶Çüä¶Çüù¶Çüê¶ÇÇâ ¶ÇÇ│¶Çüï¶Çüê¶Çüæ¶ÇüƶÇüɶÇüê¶Çüæ¶ÇüƶÇüæ¶ÇÇŶÇé┤¶ÇÇâ Journal
Chemical Thermodynamics, vol. 42, pp. 8-16, 2010.
[5] ¶ÇÇñ¶ÇÇæ¶ÇÇ«¶ÇÇæ¶ÇÇâ ¶ÇǺ¶Çüä¶Çüù¶Çüù¶Çüä¶ÇÇâ ¶Çüä¶Çüæ¶Çüç¶ÇÇâ ¶ÇÇ│¶ÇÇæ¶ÇÇ«¶ÇÇæ¶ÇÇâ ¶ÇǶÇüê¶Çüæ¶ÇÇŶÇÇâ ¶Çé│¶ÇÇ▓¶Çüô¶Çüù¶Çüî¶ÇüɶÇüî¶ÇüضÇüä¶Çüù¶Çüî¶ÇüƶÇüæ¶ÇÇâ ¶ÇüƶÇüë¶ÇÇâ ¶ÇÇ░¶Çüê¶ÇüɶÇüà¶Çüò¶Çüä¶Çüæ¶Çüê¶ÇÇâ ¶ÇÇ©¶Çüæ¶Çüî¶Çüù¶ÇÇâ ¶Çüë¶ÇüƶÇüò¶ÇÇâ
Removing Carbon Dioxide from Natural Ga¶Çüû¶ÇÇŶÇé┤¶ÇÇâ Journal of Membrane
Science, vol. 283, pp. 291-300, 2006.
[6] ¶ÇÇ│¶ÇÇæ¶ÇÇ░¶ÇÇæ¶ÇÇâ¶Çǽ¶Çüê¶Çüò¶Çüç¶Çüê¶Çüò¶ÇÇŶÇÇâ¶ÇÇ¡¶ÇÇæ¶ÇÇñ¶ÇÇæ¶ÇÇâ¶ÇüÖ¶Çüä¶Çüæ¶ÇÇâ¶ÇÇ»¶Çüÿ¶Çüî¶Çüì¶ÇüĶÇÇâ¶Çüä¶Çüæ¶Çüç¶ÇÇâ¶ÇÇ¡¶ÇÇæ¶ÇÇâ¶ÇÇѶÇüò¶Çüÿ¶Çüî¶Çüì¶Çüæ¶ÇüƶÇüƶÇüè¶Çüê¶ÇÇŶÇÇâ¶Çé│¶ÇǼ¶Çüæ¶Çüç¶Çüÿ¶Çüû¶Çüù¶Çüò¶Çüî¶Çüä¶ÇüŶÇÇâ¶Çüä¶Çüô¶Çüô¶ÇüŶÇüî¶Çüå¶Çüä¶Çüù¶Çüî¶ÇüƶÇüæ¶ÇÇâ¶ÇüƶÇüë¶ÇÇâ
RAM modeling: Development and implementation of a RAM simulation
model for the Lexan® ¶Çüô¶ÇüŶÇüä¶Çüæ¶Çüù¶ÇÇâ ¶Çüä¶Çüù¶ÇÇâ ¶ÇǬ¶ÇÇ¿¶ÇÇâ ¶Çüî¶Çüæ¶Çüç¶Çüÿ¶Çüû¶Çüù¶Çüò¶Çüî¶Çüä¶ÇüŶÇÇŶÇÇâ ¶ÇÇ│¶ÇüŶÇüä¶Çüû¶Çüù¶Çüî¶Çüå¶ÇÇŶÇé┤¶ÇÇâ Reliability
Engeneeing and System Safety , vol. 93, pp 501-508, 2008.
[7] ¶ÇǺ¶ÇÇæ¶ÇÇ░¶ÇÇæ¶ÇÇâ ¶ÇÇ»¶ÇüƶÇüÿ¶Çüî¶Çüù¶ÇÇŶÇÇâ¶ÇÇÁ¶ÇÇæ¶ÇÇâ ¶ÇÇ│¶Çüä¶Çüå¶Çüå¶Çüÿ¶Çüä¶ÇüŶÇüä¶Çüæ¶Çüç¶ÇÇâ¶Çüä¶Çüæ¶Çüç¶ÇÇâ ¶ÇÇñ¶ÇÇæ¶ÇÇ«¶ÇÇæ¶ÇǶÇÇæ¶ÇÇâ ¶ÇÇ¡¶Çüä¶Çüò¶Çüç¶Çüî¶Çüæ¶Çüê¶ÇÇŶÇÇâ ¶Çé│¶ÇÇñ¶ÇÇâ ¶Çüô¶Çüò¶Çüä¶Çüå¶Çüù¶Çüî¶Çüå¶Çüä¶ÇüŶÇÇâ ¶Çüô¶Çüò¶ÇüƶÇüå¶Çüê¶Çüç¶Çüÿ¶Çüò¶Çüê¶ÇÇâ
for the selectionof time-to-failure models based on assessment of trends
¶Çüî¶Çüæ¶ÇÇâ¶ÇüɶÇüä¶Çüî¶Çüæ¶Çüù¶Çüê¶Çüæ¶Çüä¶Çüæ¶Çüå¶Çüê¶ÇÇâ¶Çüç¶Çüä¶Çüù¶Çüä¶ÇÇæ¶Çé┤¶ÇÇâ¶ÇÇÁ¶Çüê¶ÇüŶÇüî¶Çüä¶Çüà¶Çüî¶ÇüŶÇüî¶Çüù¶Çü£¶ÇÇâ¶ÇÇ¿¶Çüæ¶Çüè¶Çüî¶Çüæ¶Çüê¶Çüê¶Çüò¶Çüî¶Çüæg & System Safety, vol. 94,
pp. 1618-1628, 2009.