Atomic Force Microscopy (AFM)Topographical Surface Characterization of Multilayer-Coated and Uncoated Carbide Inserts
In recent years, scanning probe atomic force
microscopy SPM AFM has gained acceptance over a wide spectrum
of research and science applications. Most fields focuses on physical,
chemical, biological while less attention is devoted to manufacturing
and machining aspects. The purpose of the current study is to assess
the possible implementation of the SPM AFM features and its
NanoScope software in general machining applications with special
attention to the tribological aspects of cutting tool. The surface
morphology of coated and uncoated as-received carbide inserts is
examined, analyzed, and characterized through the determination of
the appropriate scanning setting, the suitable data type imaging
techniques and the most representative data analysis parameters
using the MultiMode SPM AFM in contact mode. The NanoScope
operating software is used to capture realtime three data types
images: “Height", “Deflection" and “Friction". Three scan sizes are
independently performed: 2, 6, and 12 μm with a 2.5 μm vertical
range (Z). Offline mode analysis includes the determination of three
functional topographical parameters: surface “Roughness", power
spectral density “PSD" and “Section". The 12 μm scan size in
association with “Height" imaging is found efficient to capture every
tiny features and tribological aspects of the examined surface. Also,
“Friction" analysis is found to produce a comprehensive explanation
about the lateral characteristics of the scanned surface. Configuration
of many surface defects and drawbacks has been precisely detected
and analyzed.
[1] G. Binnig and C. F. Quate, "Atomic Force Microscope," Physical
Review Letters, vol. 9, no. 9, pp. 930-933, 1986.
[2] M. Nakamura and H. Tokumoto, "Molecular arrangement of copper
phthalocyanine on Si(001)-(2 x 1)-H: a high-resolution frictional force
microscopy and molecular mechanics study," Surface Science, vol. 398,
no. 1, pp. 143-153, Feb. 1998.
[3] T. Gray, J. Killgore, J. Luo, A. Jen and R. Overney, "Molecular mobility
and transitions in complex organic systems studied by shear force
microscopy," Nanotechnology, vol. 18, pp. 1-9, 2007.
[4] A. Noy et al., "Chemically-Sensitive imaging in tapping mode by
chemical force microscopy: Relationship between phase lag and
adhesion," Langmuir, vol. 14, no. 7, pp. 1508-1511, 1998.
[5] R. Maoz, S. Cohen and J. Sagiv, "Nanoelectrochemical patterning of
monolayer surfaces: Toward spatially defined self-assembly of
nanostructures," Advanced Materials, vol. 11, no. 1, pp. 55-61, 1999.
[6] A. Ebner et al., "Recognition imaging using atomic force microscopy,"
in Handbook of Single-Molecule Biophysics, Springer
Science+Buisiness Media, 2009, ch. 18, pp. 524-551.
[7] J. Houston et al., "Comparative study of the adhesion, friction, and
mechanical properties of CF3- and CH3-terminated alkanethiol
monolayers," Langmuir, vol. 21, no. 9, pp. 3926-3932, 2005.
[8] R. Carpick, D. Sasaki and A. Burns, "Large friction anisotropy of a
polydiacetylene monolayer," Tribology Letters, vol. 7, no. 2-3, pp. 79-
85, 1999.
[9] H. Schumacher et al., "Controlled mechanical AFM machining of twodimensional
electron systems: fabrication of a single-electron transistor,"
Physica, vol. 6, no. 1-4, pp. 860-863, Feb. 2000.
[10] M. Enachescu et al "Atomic force microscopy study of an ideally hard
contact: The diamond (111)/ tungsten carbide interface," Physical
Review Letters, vol. 81, no. 9, pp. 1877-1880, 1998.
[11] B. Bhushan, J. Israelachviii and U. Landman, "Nanotribology, friction,
wear and lubricant at atomic scale," Nature, vol. 374, pp. 607-616, 1995.
[12] B. Sumer and M. Sitti, "Rolling and Spinning Friction Characterization
of fine particles using lateral force microscopy based contact pushing,"
J. Adhesion Science Technology, vol. 22, pp. 481-506, 2008.
[13] X. Peng, Z. Barber and T. Clyne, "Surface roughness of diamond-like
carbon films prepared using various techniques," Surface and Coatings
Technology, vol. 138, pp. 23-32, 2001.
[14] B. Bhushan, "Nanotribology and nanomechanics," Wear, vol. 259, pp.
1507-1531, 2005.
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and adhesion of MEMS/NEMS materials, coatings and lubricants,"
Nanotechnology, vol. 15, no. 11, pp. 1561-1570, 2004.
[16] S. Kopta and M. Salmeron, "The atomic scale origin of wear on mica
and its contribution to friction," J. Chemical Physics, vol. 113, no. 18,
pp. 8249-8252, 2000.
[17] G. Garcia-Ayuso, L. Vázquez and J. Martínez-Duarta, "Atomic force
microscopy (AFM) morphological surface characterization of
transparent gas barrier coatings on plastic films," Surface and Coatings
Technology, vol. 80, no. 1-2, pp. 203-206, 1996.
[18] M. Sato et al., "Local mechanical properties measured by atomic force
microscopy for cultured bovine endothelial cells exposed to shear
stress,". J. Biomechanics, 2000, 33 (1), 127-135.
[19] J. Li et al., "Friction coefficients derived from apparent height variations
in contact mode atomic force microscopy images," Langmuir, vol. 15,
no. 22, pp. 7662-7669, 1999.
[20] K. Cheng, X. Luo and R. Holt, "Modelling and simulation on the tool
wear in nanometric cutting," Wear, vol. 255, no. 7, pp. 1427-1432, 2003.
[21] K. Komai, K. Minoshima S. and Inoue, "Fracture and fatigue behavior
of single crystal silicon microelements and nanoscopic AFM damage
evaluation," Microsystem Technologies, vol. 5, no. 1, pp. 30-37, 1998.
[22] http://nano.tm.agilent.com.
[23] M. Falvo et al., "Manipulation of individual viruses: Friction and
mechanical properties," Biophysical Journal, vol. 72, pp. 1396-1403,
1997.
[24] T. Chung, D. Liu, S. Wang and S. Wang, "Enhancement of the growth
of human endothelial cells by surface roughness at nanometer scale,"
Biomaterials, vol. 24, pp. 4655-4661, 2003.
[25] C. Grimellec et al., "Imaging of the surface of living cells by low-force
contact-mode atomic force microscopy," Biophysical Journal, vol. 75,
pp. 695-703, 1998.
[26] K. Barbee, P. Davies and R. Lal, "Shear stress-induced reorganization of
the surface topography of living endothelial cells imaged by atomic
force microscopy," Circulation Research, American Heart Association
(http://circres.ahajournals.org), vol. 74, pp. 163-171, 1994.
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scanning probe microscopy," Journal of Structural Biology, vol. 153,
pp. 151-159, 2006.
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systems (MEMS), opto-electronic and optical applications,"
Materials Science and Engineering, A29, pp. 230-234, 2001.
[29] Application notes of ASYLUM RESEARCH
(www.AsylumResearch.com).
[30] AFM Resource Library - Agilnet Technology (www.afmuniversity.org).
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wear testing with the atomic force microscope, solutions for a nanoscale
world," Veeco Instruments Inc., (www.veeco.com).
[32] F. Peter, A. R├╝diger and R. Waser, "Mechanical crosstalk between
vertical and lateral piezoresponse force microscopy," Review of scientific
instruments, vol. 77, 036103, pp. 1-3, 2006.
[33] A. Hoffmann, T. Jungk and E. Soergel, "Crosstalk correction in atomic
force microscopy," Review of scientific instruments, vol. 78, no. 1, 2007,
016101, doi:10.1063/1.2424448.
[34] P. Prunici and P. Hess "Quantitative characterization of crosstalk effects
for friction force microscopy with scan-by-probe SPMs,"
Ultramicroscopy, vol. 108, pp. 642-645, 2008.
[35] M. Varenberg, I. Etsion and G. Halperin, "Crosstalk problems in
scanning-by-probe atomic force microscopy," Review of scientific
instruments, vol. 74, no. 7, pp. 3569-3571, 2003.
[36] D. Richard, R. Piner, S. Rodney and R. Ruoff, "Cross talk between
friction and height signals in atomic force microscopy," Review of
scientific instruments, vol. 73, no. 9, pp. 3392-3394, 2002.
[37] G. Michal, C. Lu and A. Tieu, "Influence of force-based crosstalk on the
'wedge method' in lateral force microscopy," Measurement Science
Technology, vol. 20, 2009, doi: 10.1088/0957-0233/20/5/055103.
[38] C. Onal, B. S├╝mer and M. Sitti, "Cross-talk compensation in atomic
force microscopy," Review of scientific instruments, vol. 79, no. 10,
2008, 103706, doi:10.1063/1.3002483.
[39] R. Piner, D. Richard, R. Ruoff and S. Rodney, "Effect of friction on
height measurement of < 1nm via AFM," American Physical Society, in
the Annual APS Meeting, Indiana Convention Center, Indianapolis,
Indiana Meeting, March 18-22, 2002.
[40] S. Sundararajan and B. Bhushan, "Topography-induced contributions to
friction forces measured using an atomic force/friction force
microscope," J. Applied Physics, vol. 88, 4825, 2000, 4825,
doi:10.1063/1.1310187.
[41] A. Yurtsever, A. Gigler and R. Stark, "Amplitude and frequency
modulation torsional resonance mode atomic force microscopy of a
mineral surface," Ultramicroscopy, vol. 109, no. 3, pp. 275-279, 2009.
[42] S. Park, K. Costa and G. Ateshian, "Microscale frictional response of
bovine articular cartilage from atomic force microscopy," J
Biomechanics, vol. 37, no. 11, pp. 1679-1687, 2004.
[43] V. Koinkar and B. Bhushan, "Effect of scan size and surface roughness
on microscale friction measurements," J. Applied. Physics, vol. 81, 2472,
1997, doi:10.1063/1.363954.
[44] A. Shegaonkar, C. Lee and S. Salapaka, "Feedback scheme for improved
lateral force measurement in atomic force microscopy," in 2008
American Control Conference, Westin Seattle Hotel, Seattle,
Washington, USA, June 11-13, 2008.
[45] C. Baur et al., "Nanoparticle manipulation by mechanical pushing:
underlying phenomena and real-time monitoring," Nanotechnology, vol.
9, pp. 360-364, 1998.
[46] S. Youn et al., "AFM, SEM and nano/micro-indentation studies of the
fib-milled glassy carbon surface hat-treated at different conditions,"
MEMS and Packaging Group, Advanced Manufacturing Research
Institute, National Institute of Advanced Industrial Science and
Technology (AIST), Stresa, Italy, 26-28 April 2006.
[47] Nanoindentation and Nanoscratching with SPMs for NanoScope™
Version 4.32 Software. Support Note No. 225, Rev. F, Digital
Instruments, 1998, 112 Robin Hill Road, Santa Barbara, CA 93117.
[48] B. Bhushan and T. Kasai, "A surface topography-independent friction
measurement technique using torsional resonance mode in an AFM,"
Nanotechnology, vol. 15, 923, 2004, doi: 10.1088/0957-4484/15/8/009.
[49] M. Bische, M. Vanlandingham, R. Eduljee, Jr. Gillespie and J. Schultz,
"On the use of nanoscale indentation with the AFM in the identification
of phases in blends of linear low density polyethylene and high density
polyethylene," Journal of Materials Science, vol. 35, no. 1, pp. 221-228,
2000.
[50] Y. Yan, T. Sun, Y. Liang and S. Dong, "Investigation on AFM-based
micro/nano-CNC machining system," International Journal of Machine
Tools & Manufacture, vol. 47, pp. 1651-1859, 2007.
[51] G. Schitter, G. Fantner, J. Kindt, P. Thurner and P. Hansma, "On recent
developments for high-speed atomic force microscopy," in Proc. of the
IEEE/ASME, International Conference on Advanced Intelligent
Mechatronics, Monterey, California, USA, July 24-28, 2005, pp. 261-
264.
[52] P. Vettiger et al., "The "Millipede" nanotechnology entering data
storage," IEEE/ASME Trans on Nanotechnology, vol. 1, no. 1, pp. 39-
55, 2002.
[53] R. Carpick, N. AgraÛt, D. Ogletree and M. Salmeron, "Variation of the
interfacial shear strength and adhesion of a nanometer-sized contact,"
Langmuir, vol. 12, pp. 3334-3340, 1996.
[54] T. Larsen and K. Molonia, "Comparison of wear characteristics of
etched-silicon and carbon nanotube atomic-force microscopy probes,"
Applied Physics letters, vol. 80, no. 11, pp. 1996-1998, 2002.
[55] G. Li, N. Xi, M. Yu and W. Fung, "Development of augmented reality
system for AFM-based nanomanipulation,". IEEE/ASME Trans on
Mechatronics, vol. 9, no. 2, pp. 358-365, 2004.
[56] S. Kalinin et al., "Vector piezoresponse force microscopy," Microscopy
and Microanalysis, Microscopy Society of America, vol. 12, pp. 206-
220, 2006.
[57] M. Varenberg, I. Etsion and G. Halperin, "An improved wedge
calibration method for lateral force in atomic force microscopy," Review
of Scientific Instruments, vol. 74, no. 7, pp. 3362-3367, 2003.
[58] M. Bloo, H. Haitjem and W. Pril, "Deformation and wear of pyramidal,
silicon-nitride AFM tips scanning micrometre-size features in contact
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Instruments, Veeco Metrology Group.
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machining surfaces," Ultramicroscopy, vol. 42-44 (B), pp. 1446-1451,
1992.
[61] T. Fang and W. Chang, "Effects of AFM-based nanomachining process
on aluminum surface," Journal of Physics and Chemistry of Solids, vol.
64, pp. 913-918, 2003.
[62] T. Fang, C. Weng and J. Chang, "Machining characterization of the
nano-lithography process using atomic force microscopy,"
Nanotechnology, vol. 11, pp. 181-187, 2000.
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EDM process," Applied Surface Science, vol. 242, pp. 245-250, 2005.
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[66] NanoScope Software 6.13 User Guide. 2004, Veeco Instruments Inc.
[67] C. Poon and B. Bhushan, "Comparison of surface roughness
measurements by stylus profiler, AFM and non-contact optical profiler,"
Wear, vol. 190, pp. 76-88, 1995.
[68] S. Sundararajan and B. Bhushan, "Static friction and surface roughness
studies of surface micromachined electrostatic micromotors using an
atomic force/friction force microscope," J. Vacuum Science Technology,
vol. 19, no. 4, pp. 1777-1785, 2001.
[69] G. Simpson, D. Sedin and K. Rowlen, "Surface roughness by contact
versus tapping mode atomic force microscopy," Langmuir, vol. 15, no.
4, pp. 1429-1434, 1999.
[70] A. Ankudinov et al., "Cross-sectional atomic force microscopy of
ZnMgSSeand BeMgZnSe-based laser diodes," Applied Physics Letters,
vol. 75, no. 17, pp. 2626-2629, 1999.
[1] G. Binnig and C. F. Quate, "Atomic Force Microscope," Physical
Review Letters, vol. 9, no. 9, pp. 930-933, 1986.
[2] M. Nakamura and H. Tokumoto, "Molecular arrangement of copper
phthalocyanine on Si(001)-(2 x 1)-H: a high-resolution frictional force
microscopy and molecular mechanics study," Surface Science, vol. 398,
no. 1, pp. 143-153, Feb. 1998.
[3] T. Gray, J. Killgore, J. Luo, A. Jen and R. Overney, "Molecular mobility
and transitions in complex organic systems studied by shear force
microscopy," Nanotechnology, vol. 18, pp. 1-9, 2007.
[4] A. Noy et al., "Chemically-Sensitive imaging in tapping mode by
chemical force microscopy: Relationship between phase lag and
adhesion," Langmuir, vol. 14, no. 7, pp. 1508-1511, 1998.
[5] R. Maoz, S. Cohen and J. Sagiv, "Nanoelectrochemical patterning of
monolayer surfaces: Toward spatially defined self-assembly of
nanostructures," Advanced Materials, vol. 11, no. 1, pp. 55-61, 1999.
[6] A. Ebner et al., "Recognition imaging using atomic force microscopy,"
in Handbook of Single-Molecule Biophysics, Springer
Science+Buisiness Media, 2009, ch. 18, pp. 524-551.
[7] J. Houston et al., "Comparative study of the adhesion, friction, and
mechanical properties of CF3- and CH3-terminated alkanethiol
monolayers," Langmuir, vol. 21, no. 9, pp. 3926-3932, 2005.
[8] R. Carpick, D. Sasaki and A. Burns, "Large friction anisotropy of a
polydiacetylene monolayer," Tribology Letters, vol. 7, no. 2-3, pp. 79-
85, 1999.
[9] H. Schumacher et al., "Controlled mechanical AFM machining of twodimensional
electron systems: fabrication of a single-electron transistor,"
Physica, vol. 6, no. 1-4, pp. 860-863, Feb. 2000.
[10] M. Enachescu et al "Atomic force microscopy study of an ideally hard
contact: The diamond (111)/ tungsten carbide interface," Physical
Review Letters, vol. 81, no. 9, pp. 1877-1880, 1998.
[11] B. Bhushan, J. Israelachviii and U. Landman, "Nanotribology, friction,
wear and lubricant at atomic scale," Nature, vol. 374, pp. 607-616, 1995.
[12] B. Sumer and M. Sitti, "Rolling and Spinning Friction Characterization
of fine particles using lateral force microscopy based contact pushing,"
J. Adhesion Science Technology, vol. 22, pp. 481-506, 2008.
[13] X. Peng, Z. Barber and T. Clyne, "Surface roughness of diamond-like
carbon films prepared using various techniques," Surface and Coatings
Technology, vol. 138, pp. 23-32, 2001.
[14] B. Bhushan, "Nanotribology and nanomechanics," Wear, vol. 259, pp.
1507-1531, 2005.
[15] N. Tambe and B. Bhushan, "Scale dependence of micro/nano-friction
and adhesion of MEMS/NEMS materials, coatings and lubricants,"
Nanotechnology, vol. 15, no. 11, pp. 1561-1570, 2004.
[16] S. Kopta and M. Salmeron, "The atomic scale origin of wear on mica
and its contribution to friction," J. Chemical Physics, vol. 113, no. 18,
pp. 8249-8252, 2000.
[17] G. Garcia-Ayuso, L. Vázquez and J. Martínez-Duarta, "Atomic force
microscopy (AFM) morphological surface characterization of
transparent gas barrier coatings on plastic films," Surface and Coatings
Technology, vol. 80, no. 1-2, pp. 203-206, 1996.
[18] M. Sato et al., "Local mechanical properties measured by atomic force
microscopy for cultured bovine endothelial cells exposed to shear
stress,". J. Biomechanics, 2000, 33 (1), 127-135.
[19] J. Li et al., "Friction coefficients derived from apparent height variations
in contact mode atomic force microscopy images," Langmuir, vol. 15,
no. 22, pp. 7662-7669, 1999.
[20] K. Cheng, X. Luo and R. Holt, "Modelling and simulation on the tool
wear in nanometric cutting," Wear, vol. 255, no. 7, pp. 1427-1432, 2003.
[21] K. Komai, K. Minoshima S. and Inoue, "Fracture and fatigue behavior
of single crystal silicon microelements and nanoscopic AFM damage
evaluation," Microsystem Technologies, vol. 5, no. 1, pp. 30-37, 1998.
[22] http://nano.tm.agilent.com.
[23] M. Falvo et al., "Manipulation of individual viruses: Friction and
mechanical properties," Biophysical Journal, vol. 72, pp. 1396-1403,
1997.
[24] T. Chung, D. Liu, S. Wang and S. Wang, "Enhancement of the growth
of human endothelial cells by surface roughness at nanometer scale,"
Biomaterials, vol. 24, pp. 4655-4661, 2003.
[25] C. Grimellec et al., "Imaging of the surface of living cells by low-force
contact-mode atomic force microscopy," Biophysical Journal, vol. 75,
pp. 695-703, 1998.
[26] K. Barbee, P. Davies and R. Lal, "Shear stress-induced reorganization of
the surface topography of living endothelial cells imaged by atomic
force microscopy," Circulation Research, American Heart Association
(http://circres.ahajournals.org), vol. 74, pp. 163-171, 1994.
[27] B. Rodriguez et al., "Electromechanical imaging of biomaterials by
scanning probe microscopy," Journal of Structural Biology, vol. 153,
pp. 151-159, 2006.
[28] M. Yan et al., "On the ductile machining of silicon for micro electromechanical
systems (MEMS), opto-electronic and optical applications,"
Materials Science and Engineering, A29, pp. 230-234, 2001.
[29] Application notes of ASYLUM RESEARCH
(www.AsylumResearch.com).
[30] AFM Resource Library - Agilnet Technology (www.afmuniversity.org).
[31] C. Schmitt, J. Elings and M. Serry, "Nanoindenting, Scratching, and
wear testing with the atomic force microscope, solutions for a nanoscale
world," Veeco Instruments Inc., (www.veeco.com).
[32] F. Peter, A. R├╝diger and R. Waser, "Mechanical crosstalk between
vertical and lateral piezoresponse force microscopy," Review of scientific
instruments, vol. 77, 036103, pp. 1-3, 2006.
[33] A. Hoffmann, T. Jungk and E. Soergel, "Crosstalk correction in atomic
force microscopy," Review of scientific instruments, vol. 78, no. 1, 2007,
016101, doi:10.1063/1.2424448.
[34] P. Prunici and P. Hess "Quantitative characterization of crosstalk effects
for friction force microscopy with scan-by-probe SPMs,"
Ultramicroscopy, vol. 108, pp. 642-645, 2008.
[35] M. Varenberg, I. Etsion and G. Halperin, "Crosstalk problems in
scanning-by-probe atomic force microscopy," Review of scientific
instruments, vol. 74, no. 7, pp. 3569-3571, 2003.
[36] D. Richard, R. Piner, S. Rodney and R. Ruoff, "Cross talk between
friction and height signals in atomic force microscopy," Review of
scientific instruments, vol. 73, no. 9, pp. 3392-3394, 2002.
[37] G. Michal, C. Lu and A. Tieu, "Influence of force-based crosstalk on the
'wedge method' in lateral force microscopy," Measurement Science
Technology, vol. 20, 2009, doi: 10.1088/0957-0233/20/5/055103.
[38] C. Onal, B. S├╝mer and M. Sitti, "Cross-talk compensation in atomic
force microscopy," Review of scientific instruments, vol. 79, no. 10,
2008, 103706, doi:10.1063/1.3002483.
[39] R. Piner, D. Richard, R. Ruoff and S. Rodney, "Effect of friction on
height measurement of < 1nm via AFM," American Physical Society, in
the Annual APS Meeting, Indiana Convention Center, Indianapolis,
Indiana Meeting, March 18-22, 2002.
[40] S. Sundararajan and B. Bhushan, "Topography-induced contributions to
friction forces measured using an atomic force/friction force
microscope," J. Applied Physics, vol. 88, 4825, 2000, 4825,
doi:10.1063/1.1310187.
[41] A. Yurtsever, A. Gigler and R. Stark, "Amplitude and frequency
modulation torsional resonance mode atomic force microscopy of a
mineral surface," Ultramicroscopy, vol. 109, no. 3, pp. 275-279, 2009.
[42] S. Park, K. Costa and G. Ateshian, "Microscale frictional response of
bovine articular cartilage from atomic force microscopy," J
Biomechanics, vol. 37, no. 11, pp. 1679-1687, 2004.
[43] V. Koinkar and B. Bhushan, "Effect of scan size and surface roughness
on microscale friction measurements," J. Applied. Physics, vol. 81, 2472,
1997, doi:10.1063/1.363954.
[44] A. Shegaonkar, C. Lee and S. Salapaka, "Feedback scheme for improved
lateral force measurement in atomic force microscopy," in 2008
American Control Conference, Westin Seattle Hotel, Seattle,
Washington, USA, June 11-13, 2008.
[45] C. Baur et al., "Nanoparticle manipulation by mechanical pushing:
underlying phenomena and real-time monitoring," Nanotechnology, vol.
9, pp. 360-364, 1998.
[46] S. Youn et al., "AFM, SEM and nano/micro-indentation studies of the
fib-milled glassy carbon surface hat-treated at different conditions,"
MEMS and Packaging Group, Advanced Manufacturing Research
Institute, National Institute of Advanced Industrial Science and
Technology (AIST), Stresa, Italy, 26-28 April 2006.
[47] Nanoindentation and Nanoscratching with SPMs for NanoScope™
Version 4.32 Software. Support Note No. 225, Rev. F, Digital
Instruments, 1998, 112 Robin Hill Road, Santa Barbara, CA 93117.
[48] B. Bhushan and T. Kasai, "A surface topography-independent friction
measurement technique using torsional resonance mode in an AFM,"
Nanotechnology, vol. 15, 923, 2004, doi: 10.1088/0957-4484/15/8/009.
[49] M. Bische, M. Vanlandingham, R. Eduljee, Jr. Gillespie and J. Schultz,
"On the use of nanoscale indentation with the AFM in the identification
of phases in blends of linear low density polyethylene and high density
polyethylene," Journal of Materials Science, vol. 35, no. 1, pp. 221-228,
2000.
[50] Y. Yan, T. Sun, Y. Liang and S. Dong, "Investigation on AFM-based
micro/nano-CNC machining system," International Journal of Machine
Tools & Manufacture, vol. 47, pp. 1651-1859, 2007.
[51] G. Schitter, G. Fantner, J. Kindt, P. Thurner and P. Hansma, "On recent
developments for high-speed atomic force microscopy," in Proc. of the
IEEE/ASME, International Conference on Advanced Intelligent
Mechatronics, Monterey, California, USA, July 24-28, 2005, pp. 261-
264.
[52] P. Vettiger et al., "The "Millipede" nanotechnology entering data
storage," IEEE/ASME Trans on Nanotechnology, vol. 1, no. 1, pp. 39-
55, 2002.
[53] R. Carpick, N. AgraÛt, D. Ogletree and M. Salmeron, "Variation of the
interfacial shear strength and adhesion of a nanometer-sized contact,"
Langmuir, vol. 12, pp. 3334-3340, 1996.
[54] T. Larsen and K. Molonia, "Comparison of wear characteristics of
etched-silicon and carbon nanotube atomic-force microscopy probes,"
Applied Physics letters, vol. 80, no. 11, pp. 1996-1998, 2002.
[55] G. Li, N. Xi, M. Yu and W. Fung, "Development of augmented reality
system for AFM-based nanomanipulation,". IEEE/ASME Trans on
Mechatronics, vol. 9, no. 2, pp. 358-365, 2004.
[56] S. Kalinin et al., "Vector piezoresponse force microscopy," Microscopy
and Microanalysis, Microscopy Society of America, vol. 12, pp. 206-
220, 2006.
[57] M. Varenberg, I. Etsion and G. Halperin, "An improved wedge
calibration method for lateral force in atomic force microscopy," Review
of Scientific Instruments, vol. 74, no. 7, pp. 3362-3367, 2003.
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@article{"International Journal of Mechanical, Industrial and Aerospace Sciences:51717", author = "Samy E. Oraby and Ayman M. Alaskari", title = "Atomic Force Microscopy (AFM)Topographical Surface Characterization of Multilayer-Coated and Uncoated Carbide Inserts", abstract = "In recent years, scanning probe atomic force
microscopy SPM AFM has gained acceptance over a wide spectrum
of research and science applications. Most fields focuses on physical,
chemical, biological while less attention is devoted to manufacturing
and machining aspects. The purpose of the current study is to assess
the possible implementation of the SPM AFM features and its
NanoScope software in general machining applications with special
attention to the tribological aspects of cutting tool. The surface
morphology of coated and uncoated as-received carbide inserts is
examined, analyzed, and characterized through the determination of
the appropriate scanning setting, the suitable data type imaging
techniques and the most representative data analysis parameters
using the MultiMode SPM AFM in contact mode. The NanoScope
operating software is used to capture realtime three data types
images: “Height", “Deflection" and “Friction". Three scan sizes are
independently performed: 2, 6, and 12 μm with a 2.5 μm vertical
range (Z). Offline mode analysis includes the determination of three
functional topographical parameters: surface “Roughness", power
spectral density “PSD" and “Section". The 12 μm scan size in
association with “Height" imaging is found efficient to capture every
tiny features and tribological aspects of the examined surface. Also,
“Friction" analysis is found to produce a comprehensive explanation
about the lateral characteristics of the scanned surface. Configuration
of many surface defects and drawbacks has been precisely detected
and analyzed.", keywords = "SPM AFM contact mode, carbide inserts, scan size,surface defects, surface roughness, PSD.", volume = "4", number = "10", pages = "941-12", }
