X-Ray Intensity Measurement Using Frequency Output Sensor for Computed Tomography
Quality of 2D and 3D cross-sectional images produce
by Computed Tomography primarily depend upon the degree of
precision of primary and secondary X-Ray intensity detection.
Traditional method of primary intensity detection is apt to errors.
Recently the X-Ray intensity measurement system along with smart
X-Ray sensors is developed by our group which is able to detect
primary X-Ray intensity unerringly. In this study a new smart X-Ray
sensor is developed using Light-to-Frequency converter TSL230
from Texas Instruments which has numerous advantages in terms of
noiseless data acquisition and transmission. TSL230 construction is
based on a silicon photodiode which converts incoming X-Ray
radiation into the proportional current signal. A current to frequency
converter is attached to this photodiode on a single monolithic CMOS
integrated circuit which provides proportional frequency count to
incoming current signal in the form of the pulse train. The frequency
count is delivered to the center of PICDEM FS USB board with
PIC18F4550 microcontroller mounted on it. With highly compact
electronic hardware, this Demo Board efficiently read the smart
sensor output data. The frequency output approaches overcome
nonlinear behavior of sensors with analog output thus un-attenuated
X-Ray intensities could be measured precisely and better
normalization could be acquired in order to attain high resolution.
[1] J. D. Bronzino, Biomedical Engineering Handbook, Volume I. CRC Press, 1999, p. 1656.
[2] R. Siddiqui, I. U. Ahad, S. Amir, B. Aklan, and T. Uddin, "X-Ray IO Monitor Device for Primary Intensity Measurement in Computed Tomography (CT) Scanner," in 4th International Conference on Biomedical Engineering in Vietnam, 2013, vol. 40, pp. 33-36.
[3] I. U. Ahad, R. M. Siddiqui, and Z. Islam, "Cesium Iodide and Scheelite Coupled X-Ray Sensors Characterization for Industrial Applications of Computed Tomography (CT) as Non Destructive Testing (NDT)," in Imaging and Signal Processing in Health Care and Technology / 772: Human-Computer Interaction / 773: Communication, Internet and Information Technology, 2012.
[4] R. M. Siddiqui, I. U. Ahad, S. S. Zehra, and Anurag, "Characterization of X-Ray Sensors and Io Monitor Device Testing for Primary and Secondary Intensities Measurement," in 4th International Conference on Biomedical Engineering in Vietnam IFMBE Proceedings, 2013, vol. 40, pp. 37-40.
[5] I. U. Ahad, R. Siddiqui, B. Aklan, and S. Zehra, "Scheelite Coupled Photodiode X-Ray Sensor Designing and haracterization," in 4th International Conference on Biomedical Engineering in Vietnam, 2013, vol. 40, pp. 41-44.
[6] R. M. Siddiqui, I. U. Ahad, B. Aklan, A. Anurag, Z. Islam, S. S. Zehra, and H. S. J. Soto, "X-Ray Io Monitor Measuring Device for X-Ray Intensity for Industrial Testing Applications," in Biomedical Engineering / 765: Telehealth / 766: Assistive Technologies, 2012.
[1] J. D. Bronzino, Biomedical Engineering Handbook, Volume I. CRC Press, 1999, p. 1656.
[2] R. Siddiqui, I. U. Ahad, S. Amir, B. Aklan, and T. Uddin, "X-Ray IO Monitor Device for Primary Intensity Measurement in Computed Tomography (CT) Scanner," in 4th International Conference on Biomedical Engineering in Vietnam, 2013, vol. 40, pp. 33-36.
[3] I. U. Ahad, R. M. Siddiqui, and Z. Islam, "Cesium Iodide and Scheelite Coupled X-Ray Sensors Characterization for Industrial Applications of Computed Tomography (CT) as Non Destructive Testing (NDT)," in Imaging and Signal Processing in Health Care and Technology / 772: Human-Computer Interaction / 773: Communication, Internet and Information Technology, 2012.
[4] R. M. Siddiqui, I. U. Ahad, S. S. Zehra, and Anurag, "Characterization of X-Ray Sensors and Io Monitor Device Testing for Primary and Secondary Intensities Measurement," in 4th International Conference on Biomedical Engineering in Vietnam IFMBE Proceedings, 2013, vol. 40, pp. 37-40.
[5] I. U. Ahad, R. Siddiqui, B. Aklan, and S. Zehra, "Scheelite Coupled Photodiode X-Ray Sensor Designing and haracterization," in 4th International Conference on Biomedical Engineering in Vietnam, 2013, vol. 40, pp. 41-44.
[6] R. M. Siddiqui, I. U. Ahad, B. Aklan, A. Anurag, Z. Islam, S. S. Zehra, and H. S. J. Soto, "X-Ray Io Monitor Measuring Device for X-Ray Intensity for Industrial Testing Applications," in Biomedical Engineering / 765: Telehealth / 766: Assistive Technologies, 2012.
@article{"International Journal of Medical, Medicine and Health Sciences:49938", author = "R. M. Siddiqui and D. Z. Moghaddam and T. R. Turlapati and S. H. Khan and I. Ul Ahad", title = "X-Ray Intensity Measurement Using Frequency Output Sensor for Computed Tomography", abstract = "Quality of 2D and 3D cross-sectional images produce
by Computed Tomography primarily depend upon the degree of
precision of primary and secondary X-Ray intensity detection.
Traditional method of primary intensity detection is apt to errors.
Recently the X-Ray intensity measurement system along with smart
X-Ray sensors is developed by our group which is able to detect
primary X-Ray intensity unerringly. In this study a new smart X-Ray
sensor is developed using Light-to-Frequency converter TSL230
from Texas Instruments which has numerous advantages in terms of
noiseless data acquisition and transmission. TSL230 construction is
based on a silicon photodiode which converts incoming X-Ray
radiation into the proportional current signal. A current to frequency
converter is attached to this photodiode on a single monolithic CMOS
integrated circuit which provides proportional frequency count to
incoming current signal in the form of the pulse train. The frequency
count is delivered to the center of PICDEM FS USB board with
PIC18F4550 microcontroller mounted on it. With highly compact
electronic hardware, this Demo Board efficiently read the smart
sensor output data. The frequency output approaches overcome
nonlinear behavior of sensors with analog output thus un-attenuated
X-Ray intensities could be measured precisely and better
normalization could be acquired in order to attain high resolution.", keywords = "Computed tomography, detector technology, X-Ray intensity measurement", volume = "7", number = "6", pages = "225-4", }