Synthesis and Characterization of Non-Aqueous Electrodeposited ZnSe Thin Film

A nanocrystalline thin film of ZnSe was successfully
electrodeposited on copper substrate using a non-aqueous solution
and subsequently annealed in air at 400°C. XRD analysis indicates
the polycrystalline deposit of (111) plane in both the cases. The
sharpness of the peak increases due to annealing of the film and
average grain size increases to 20 nm to 27nm. SEM photograph
indicate that grains are uniform and densely distributed over the
surface. Annealing increases the average grain size by 20%. The EDS
spectroscopy shows the ratio of Zn & Se is 1.1 in case of annealed
film. AFM analysis indicates the average roughness of the film
reduces from 181nm to 165nm due to annealing of the film. The
bandgap also decreases from 2.71eV to 2.62eV.





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