Modeling Electric Field Distribution on Insulator under Electron Bombardment in Vacuum
Charging and discharging phenomenon on the surface
of materials can be found in plasma display panel, spacecraft
charging, high voltage insulator, etc. This report gives a simple
explanation on this phenomenon. A scanning electron microscope
was used not only as a tool to produce energetic electron beam to
charge an insulator without metallic coating and to produce a surface
discharging (surface breakdown/flashover) but also to observe the
visible charging and discharging on the sample surface. A model of
electric field distribution on the surface was developed in order to
explain charging and discharging phenomena. Since charging and
discharging process involves incubation time, therefore this process
can be used to evaluate the insulation property of materials under
electron bombardment.
[1] K.T. Sirait, 18th International Conference on Lightning, Munchen, pp.
16-20, Sept.1985.
[2] Y. Yamano, A. Ohashi, K. Kato, H. Okubo, and Y. Hakamata, Y.,"
"Charging Characteristics on Dielectric Surface by Different Charging
Processes in Vacuum", IEEE Trans. Diel. Elect.Insul., Vol.6, No.4,
pp.464-468, 1999.
[3] W. Kalbreier and B. Goddard; "Radiation-triggered breakdown
phenomena in high energy e+e- colliders", IEEE Trans. Elec. Insul., vol.
28 (4), pp. 444-453, 1993.
[4] G.M. Sessler, M.T. Figueiredo, G.F Leal. and Frreira, IEEE Trans. on
Dielectr. Electr. Insul., vol.11(2), pp.192-202, 2004.
[5] Y.S. Liu, G.J. Zhang, W.B. Zhao, and Z. Yan, Appl. Surf. Sci., vol.
230(1-4), pp.12-17, 2004.
[6] H.C. Miller, IEEE Trans. Electr. Insul., Vol. 24(5), pp. 765-788, 1989.
[7] A. Neuber, M. Butcher, L.L. Hatfield, H. Krompholz, J. Appl. Phys.,
Vol. 85, p. 3084, 1999.
[8] Y.S. Choi, H.J. Kim, and B.J. Shin, EEE Trans. Electron Devices, vol.
51(8), pp. 1241-1244, 2004.
[9] K.G. Balmain, and W. Hirt, IEEE Trans. On Nuclear Science, Vol. NS-
27(6), pp.1770-1775, 1980.
[10] K.G. Balmain, and W. Hirt, IEEE Trans. Electr. Insul., Vol. EI. 18(5),
pp. 498-503, 1983.
[11] C. Le Gressus, and G. Blaise, IEEE Trans. on Electr. Insulation, vol.
27(3), pp. 472-481, 1992.
[12] A.G.E. Sutjipto, T. Okamoto, and M. Takata, Key Eng. Mater., vol. 181-
182, pp.231-234, 2000.
[13] A.G.E. Sutjipto, T. Okamoto, and M. Takata, Trans. Mater. Res. Soc.
Jpn., vol. 25(1), pp. 193-196, 2000.
[14] J. Cazaux, J. Appl. Phys., vol. 85(2), pp.1137-1147, 1999.
[15] A.G.E. Sutjipto, R. Muhida, and M. Takata, Proceeding of 8th
International Conference on Properties and Application of Dielectric
Materials, pp.216-219, 2006.
[16] A.G.E. Sutjipto, and M. Takata, Journal of Materials Science, Springer,
vol. 42, pp.6036-6040, 2007.
[17] A.G.E. Sutjipto, Canadian Journal of Pure and Applied Sciences, vol.
1(1), pp. 73-77, 2007.
[18] A.G.E. Sutjipto, Key Engineering Materials, vol. 345-346, p. 1609,
2007.
[19] H. Niedrig, J. Appl. Phys., vol. 53R15, 1982.
[20] J. Cazaux, J. Appl. Phys., vol. 59(5), pp.1418-1430, 1986.
[1] K.T. Sirait, 18th International Conference on Lightning, Munchen, pp.
16-20, Sept.1985.
[2] Y. Yamano, A. Ohashi, K. Kato, H. Okubo, and Y. Hakamata, Y.,"
"Charging Characteristics on Dielectric Surface by Different Charging
Processes in Vacuum", IEEE Trans. Diel. Elect.Insul., Vol.6, No.4,
pp.464-468, 1999.
[3] W. Kalbreier and B. Goddard; "Radiation-triggered breakdown
phenomena in high energy e+e- colliders", IEEE Trans. Elec. Insul., vol.
28 (4), pp. 444-453, 1993.
[4] G.M. Sessler, M.T. Figueiredo, G.F Leal. and Frreira, IEEE Trans. on
Dielectr. Electr. Insul., vol.11(2), pp.192-202, 2004.
[5] Y.S. Liu, G.J. Zhang, W.B. Zhao, and Z. Yan, Appl. Surf. Sci., vol.
230(1-4), pp.12-17, 2004.
[6] H.C. Miller, IEEE Trans. Electr. Insul., Vol. 24(5), pp. 765-788, 1989.
[7] A. Neuber, M. Butcher, L.L. Hatfield, H. Krompholz, J. Appl. Phys.,
Vol. 85, p. 3084, 1999.
[8] Y.S. Choi, H.J. Kim, and B.J. Shin, EEE Trans. Electron Devices, vol.
51(8), pp. 1241-1244, 2004.
[9] K.G. Balmain, and W. Hirt, IEEE Trans. On Nuclear Science, Vol. NS-
27(6), pp.1770-1775, 1980.
[10] K.G. Balmain, and W. Hirt, IEEE Trans. Electr. Insul., Vol. EI. 18(5),
pp. 498-503, 1983.
[11] C. Le Gressus, and G. Blaise, IEEE Trans. on Electr. Insulation, vol.
27(3), pp. 472-481, 1992.
[12] A.G.E. Sutjipto, T. Okamoto, and M. Takata, Key Eng. Mater., vol. 181-
182, pp.231-234, 2000.
[13] A.G.E. Sutjipto, T. Okamoto, and M. Takata, Trans. Mater. Res. Soc.
Jpn., vol. 25(1), pp. 193-196, 2000.
[14] J. Cazaux, J. Appl. Phys., vol. 85(2), pp.1137-1147, 1999.
[15] A.G.E. Sutjipto, R. Muhida, and M. Takata, Proceeding of 8th
International Conference on Properties and Application of Dielectric
Materials, pp.216-219, 2006.
[16] A.G.E. Sutjipto, and M. Takata, Journal of Materials Science, Springer,
vol. 42, pp.6036-6040, 2007.
[17] A.G.E. Sutjipto, Canadian Journal of Pure and Applied Sciences, vol.
1(1), pp. 73-77, 2007.
[18] A.G.E. Sutjipto, Key Engineering Materials, vol. 345-346, p. 1609,
2007.
[19] H. Niedrig, J. Appl. Phys., vol. 53R15, 1982.
[20] J. Cazaux, J. Appl. Phys., vol. 59(5), pp.1418-1430, 1986.
@article{"International Journal of Chemical, Materials and Biomolecular Sciences:62154", author = "A.G.E. Sutjipto and Jufriadi and R. Muhida and Afzeri and E.Y. Adesta", title = "Modeling Electric Field Distribution on Insulator under Electron Bombardment in Vacuum", abstract = "Charging and discharging phenomenon on the surface
of materials can be found in plasma display panel, spacecraft
charging, high voltage insulator, etc. This report gives a simple
explanation on this phenomenon. A scanning electron microscope
was used not only as a tool to produce energetic electron beam to
charge an insulator without metallic coating and to produce a surface
discharging (surface breakdown/flashover) but also to observe the
visible charging and discharging on the sample surface. A model of
electric field distribution on the surface was developed in order to
explain charging and discharging phenomena. Since charging and
discharging process involves incubation time, therefore this process
can be used to evaluate the insulation property of materials under
electron bombardment.", keywords = "Flashover, SEM, Electron Bombardment, Electric
Field.", volume = "3", number = "5", pages = "279-4", }