Abstract: Digital systems are said to be constructed using basic logic gates. These gates are the NOR, NAND, AND, OR, EXOR & EXNOR gates. This paper presents a robust three transistors (3T) based NAND and NOR gates with precise output logic levels, yet maintaining equivalent performance than the existing logic structures. This new set of 3T logic gates are based on CMOS inverter and Pass Transistor Logic (PTL). The new universal logic gates are characterized by better speed and lower power dissipation which can be straightforwardly fabricated as memory ICs for high performance computer networks. The simulation tests were performed using standard BPTM 22nm process technology using SYNOPSYS HSPICE. The 3T NAND gate is evaluated using C17 benchmark circuit and 3T NOR is gate evaluated using a D-Latch. According to HSPICE simulation in 22 nm CMOS BPTM process technology under given conditions and at room temperature, the proposed 3T gates shows an improvement of 88% less power consumption on an average over conventional CMOS logic gates. The devices designed with 3T gates will make longer battery life by ensuring extremely low power consumption.
Abstract: The evolution of logic circuits, which falls under the heading of evolvable hardware, is carried out by evolutionary algorithms. These algorithms are able to automatically configure reconfigurable devices. One of main difficulties in developing evolvable hardware with the ability to design functional electrical circuits is to choose the most favourable EA features such as fitness function, chromosome representations, population size, genetic operators and individual selection. Until now several researchers from the evolvable hardware community have used and tuned these parameters and various rules on how to select the value of a particular parameter have been proposed. However, to date, no one has presented a study regarding the size of the chromosome representation (circuit layout) to be used as a platform for the evolution in order to increase the evolvability, reduce the number of generations and optimize the digital logic circuits through reducing the number of logic gates. In this paper this topic has been thoroughly investigated and the optimal parameters for these EA features have been proposed. The evolution of logic circuits has been carried out by an extrinsic evolvable hardware system which uses (1+λ) evolution strategy as the core of the evolution.
Abstract: Evolvable hardware (EHW) is a developing field that
applies evolutionary algorithm (EA) to automatically design circuits,
antennas, robot controllers etc. A lot of research has been done in this
area and several different EAs have been introduced to tackle
numerous problems, as scalability, evolvability etc. However every
time a specific EA is chosen for solving a particular task, all its
components, such as population size, initialization, selection
mechanism, mutation rate, and genetic operators, should be selected
in order to achieve the best results. In the last three decade the
selection of the right parameters for the EA-s components for solving
different “test-problems" has been investigated. In this paper the
behaviour of mutation rate for designing logic circuits, which has not
been done before, has been deeply analyzed. The mutation rate for an
EHW system modifies the number of inputs of each logic gates, the
functionality (for example from AND to NOR) and the connectivity
between logic gates. The behaviour of the mutation has been
analyzed based on the number of generations, genotype redundancy
and number of logic gates for the evolved circuits. The experimental
results found provide the behaviour of the mutation rate during
evolution for the design and optimization of simple logic circuits.
The experimental results propose the best mutation rate to be used for
designing combinational logic circuits. The research presented is
particular important for those who would like to implement a
dynamic mutation rate inside the evolutionary algorithm for evolving
digital circuits. The researches on the mutation rate during the last 40
years are also summarized.