A Renovated Cook's Distance Based On The Buckley-James Estimate In Censored Regression

There have been various methods created based on the regression ideas to resolve the problem of data set containing censored observations, i.e. the Buckley-James method, Miller-s method, Cox method, and Koul-Susarla-Van Ryzin estimators. Even though comparison studies show the Buckley-James method performs better than some other methods, it is still rarely used by researchers mainly because of the limited diagnostics analysis developed for the Buckley-James method thus far. Therefore, a diagnostic tool for the Buckley-James method is proposed in this paper. It is called the renovated Cook-s Distance, (RD* i ) and has been developed based on the Cook-s idea. The renovated Cook-s Distance (RD* i ) has advantages (depending on the analyst demand) over (i) the change in the fitted value for a single case, DFIT* i as it measures the influence of case i on all n fitted values Yˆ∗ (not just the fitted value for case i as DFIT* i) (ii) the change in the estimate of the coefficient when the ith case is deleted, DBETA* i since DBETA* i corresponds to the number of variables p so it is usually easier to look at a diagnostic measure such as RD* i since information from p variables can be considered simultaneously. Finally, an example using Stanford Heart Transplant data is provided to illustrate the proposed diagnostic tool.

Evaluation Process for the Hardware Safety Integrity Level

Safety instrumented systems (SISs) are becoming increasingly complex and the proportion of programmable electronic parts is growing. The IEC 61508 global standard was established to ensure the functional safety of SISs, but it was expressed in highly macroscopic terms. This study introduces an evaluation process for hardware safety integrity levels through failure modes, effects, and diagnostic analysis (FMEDA).FMEDA is widely used to evaluate safety levels, and it provides the information on failure rates and failure mode distributions necessary to calculate a diagnostic coverage factor for a given component. In our evaluation process, the components of the SIS subsystem are first defined in terms of failure modes and effects. Then, the failure rate and failure mechanism distribution are assigned to each component. The safety mode and detectability of each failure mode are determined for each component. Finally, the hardware safety integrity level is evaluated based on the calculated results.