Abstract: The resistive-inductive-capacitive behavior of long
interconnects which are driven by CMOS gates are presented in this
paper. The analysis is based on the ¤Ç-model of a RLC load and is
developed for submicron devices. Accurate and analytical
expressions for the output load voltage, the propagation delay and the
short circuit power dissipation have been proposed after solving a
system of differential equations which accurately describe the
behavior of the circuit. The effect of coupling capacitance between
input and output and the short circuit current on these performance
parameters are also incorporated in the proposed model. The
estimated proposed delay and short circuit power dissipation are in
very good agreement with the SPICE simulation with average
relative error less than 6%.
Abstract: This work proposes an accurate crosstalk noise estimation method in the presence of multiple RLC lines for the use in design automation tools. This method correctly models the loading effects of non switching aggressors and aggressor tree branches using resistive shielding effect and realistic exponential input waveforms. Noise peak and width expressions have been derived. The results obtained are at good agreement with SPICE results. Results show that average error for noise peak is 4.7% and for the width is 6.15% while allowing a very fast analysis.
Abstract: Fast delay estimation methods, as opposed to
simulation techniques, are needed for incremental performance
driven layout synthesis. On-chip inductive effects are becoming
predominant in deep submicron interconnects due to increasing clock
speed and circuit complexity. Inductance causes noise in signal
waveforms, which can adversely affect the performance of the circuit
and signal integrity. Several approaches have been put forward which
consider the inductance for on-chip interconnect modelling. But for
even much higher frequency, of the order of few GHz, the shunt
dielectric lossy component has become comparable to that of other
electrical parameters for high speed VLSI design. In order to cope up
with this effect, on-chip interconnect has to be modelled as
distributed RLCG line. Elmore delay based methods, although
efficient, cannot accurately estimate the delay for RLCG interconnect
line. In this paper, an accurate analytical delay model has been
derived, based on first and second moments of RLCG
interconnection lines. The proposed model considers both the effect
of inductance and conductance matrices. We have performed the
simulation in 0.18μm technology node and an error of as low as less
as 5% has been achieved with the proposed model when compared to
SPICE. The importance of the conductance matrices in interconnect
modelling has also been discussed and it is shown that if G is
neglected for interconnect line modelling, then it will result an delay
error of as high as 6% when compared to SPICE.