Abstract: This paper presents a Reliability-Based Topology
Optimization (RBTO) based on Evolutionary Structural Optimization
(ESO). An actual design involves uncertain conditions such as
material property, operational load and dimensional variation.
Deterministic Topology Optimization (DTO) is obtained without
considering of the uncertainties related to the uncertainty parameters.
However, RBTO involves evaluation of probabilistic constraints,
which can be done in two different ways, the reliability index
approach (RIA) and the performance measure approach (PMA). Limit
state function is approximated using Monte Carlo Simulation and
Central Composite Design for reliability analysis. ESO, one of the
topology optimization techniques, is adopted for topology
optimization. Numerical examples are presented to compare the DTO
with RBTO.
Abstract: In this document, we have proposed a robust
conceptual strategy, in order to improve the robustness against the manufacturing defects and thus the reliability of logic CMOS circuits. However, in order to enable the use of future CMOS
technology nodes this strategy combines various types of design:
DFR (Design for Reliability), techniques of tolerance: hardware
redundancy TMR (Triple Modular Redundancy) for hard error
tolerance, the DFT (Design for Testability. The Results on largest ISCAS and ITC benchmark circuits show that our approach improves
considerably the reliability, by reducing the key factors, the area costs and fault tolerance probability.