Study of Natural Patterns on Digital Image Correlation Using Simulation Method

Digital image correlation (DIC) is a contactless fullfield
displacement and strain reconstruction technique commonly
used in the field of experimental mechanics. Comparing with
physical measuring devices, such as strain gauges, which only
provide very restricted coverage and are expensive to deploy widely,
the DIC technique provides the result with full-field coverage and
relative high accuracy using an inexpensive and simple experimental
setup. It is very important to study the natural patterns effect on the
DIC technique because the preparation of the artificial patterns is
time consuming and hectic process. The objective of this research is
to study the effect of using images having natural pattern on the
performance of DIC. A systematical simulation method is used to
build simulated deformed images used in DIC. A parameter (subset
size) used in DIC can have an effect on the processing and accuracy
of DIC and even cause DIC to failure. Regarding to the picture
parameters (correlation coefficient), the higher similarity of two
subset can lead the DIC process to fail and make the result more
inaccurate. The pictures with good and bad quality for DIC methods
have been presented and more importantly, it is a systematic way to
evaluate the quality of the picture with natural patterns before they
install the measurement devices.





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