Internal Surface Measurement of Nanoparticle with Polarization-interferometric Nonlinear Confocal Microscope

Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized particle with optical anisotropy. The anisotropy in the particle was spectroscopically imaged through a three-dimensional distribution of third-order nonlinear dielectric polarization photoinduced.

Authors:

• Chikara Egami
• Kazuhiro Kuwahara

Keywords:

• nanoparticle
• optical storage
• microscope

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