Abstract: As semi-conductor manufacturing technology evolves; the single event transient problem becomes more significant issue. Single event transient has a critical impact on both combinational and sequential logic circuits, so it is important to evaluate the soft error tolerance of the circuits at the design stage. In this paper, we present a soft error detecting simulation using scan chain. The simulation model generates a single event transient randomly in the circuit, and detects the soft error during the execution of the test patterns. We verified this model by inserting a scan chain in an 8051 microprocessor using 65 nm CMOS technology. While the test patterns generated by ATPG program are passing through the scan chain, we insert a single event transient and detect the number of soft errors per sub-module. The experiments show that the soft error rates per cell area of the SFR module is 277% larger than other modules.
Abstract: FlexRay, as a communication protocol for automotive
control systems, is developed to fulfill the increasing demand on the
electronic control units for implementing systems with higher safety
and more comfort. In this work, we study the impact of
radiation-induced soft errors on FlexRay-based steer-by-wire system.
We injected the soft errors into general purpose register set of FlexRay
nodes to identify the most critical registers, the failure modes of the
steer-by-wire system, and measure the probability distribution of
failure modes when an error occurs in the register file.