On-Chip Aging Sensor Circuit Based on Phase Locked Loop Circuit

In sub micrometer technology, the aging phenomenon starts to have a significant impact on the reliability of integrated circuits by bringing performance degradation. For that reason, it is important to have a capability to evaluate the aging effects accurately. This paper presents an accurate aging measurement approach based on phase-locked loop (PLL) and voltage-controlled oscillator (VCO) circuit. The architecture is rejecting the circuit self-aging effect from the characteristics of PLL, which is generating the frequency without any aging phenomena affects. The aging monitor is implemented in low power 32 nm CMOS technology, and occupies a pretty small area. Aging simulation results show that the proposed aging measurement circuit improves accuracy by about 2.8% at high temperature and 19.6% at high voltage.

Understanding Charge Dynamics in Elastomers Adopting Pulsed Electro Acoustic (PEA) Technique

In the present work, Pulsed Electro Acoustic (PEA) technique was adopted to understand the space charge dynamics in elastomeric material. It is observed that the polarity of the applied DC voltage voltage and its magnitude alters the space charge dynamics in insulation structure. It is also noticed that any addition of compound to the base material/processing technique have characteristic variation in the space charge injection process. It could be concluded based on the present work that the plasticizer could inject heterocharges into the insulation medium. Also it is realized that space charge magnitude is less with the addition of plasticizer. In the PEA studies, it is observed that local electric field in the insulating material can be much more than applied electric field due to space charge formation. One of the important conclusions arrived at based on PEA technique is that one could understand the safe operating electric field of an insulation material and the charge trap sites.

The Influence of Electrode Heating On the Force Generated On a High Voltage Capacitor with Asymmetrical Electrodes

When a high DC voltage is applied to a capacitor with strongly asymmetrical electrodes, it generates a mechanical force that affects the whole capacitor. This is caused by the motion of ions generated around the smaller of the two electrodes and their subsequent interaction with the surrounding medium. If one of the electrodes is heated, it changes the conditions around the capacitor and influences the process of ionisation, thus changing the value of the generated force. This paper describes these changes and gives reasons behind them. Further the experimental results are given as proof of the ionic mechanism of the phenomenon.