Abstract: This paper presents a novel CMOS four-transistor
SRAM cell for very high density and low power embedded SRAM
applications as well as for stand-alone SRAM applications. This cell
retains its data with leakage current and positive feedback without
refresh cycle. The new cell size is 20% smaller than a conventional
six-transistor cell using same design rules. Also proposed cell uses
two word-lines and one pair bit-line. Read operation perform from
one side of cell, and write operation perform from another side of
cell, and swing voltage reduced on word-lines thus dynamic power
during read/write operation reduced. The fabrication process is fully
compatible with high-performance CMOS logic technologies,
because there is no need to integrate a poly-Si resistor or a TFT load.
HSPICE simulation in standard 0.25μm CMOS technology confirms
all results obtained from this paper.
Abstract: This paper proposes a low power SRAM based on
five transistor SRAM cell. Proposed SRAM uses novel word-line
decoding such that, during read/write operation, only selected cell
connected to bit-line whereas, in conventional SRAM (CV-SRAM),
all cells in selected row connected to their bit-lines, which in turn
develops differential voltages across all bit-lines, and this makes
energy consumption on unselected bit-lines. In proposed SRAM
memory array divided into two halves and this causes data-line
capacitance to reduce. Also proposed SRAM uses one bit-line and
thus has lower bit-line leakage compared to CV-SRAM.
Furthermore, the proposed SRAM incurs no area overhead, and has
comparable read/write performance versus the CV-SRAM.
Simulation results in standard 0.25μm CMOS technology shows in
worst case proposed SRAM has 80% smaller dynamic energy
consumption in each cycle compared to CV-SRAM. Besides, energy
consumption in each cycle of proposed SRAM and CV-SRAM
investigated analytically, the results of which are in good agreement
with the simulation results.