A Partially Accelerated Life Test Planning with Competing Risks and Linear Degradation Path under Tampered Failure Rate Model

In this paper, we propose a method to model the relationship between failure time and degradation for a simple step stress test where underlying degradation path is linear and different causes of failure are possible. It is assumed that the intensity function depends only on the degradation value. No assumptions are made about the distribution of the failure times. A simple step-stress test is used to shorten failure time of products and a tampered failure rate (TFR) model is proposed to describe the effect of the changing stress on the intensities. We assume that some of the products that fail during the test have a cause of failure that is only known to belong to a certain subset of all possible failures. This case is known as masking. In the presence of masking, the maximum likelihood estimates (MLEs) of the model parameters are obtained through an expectation-maximization (EM) algorithm by treating the causes of failure as missing values. The effect of incomplete information on the estimation of parameters is studied through a Monte-Carlo simulation. Finally, a real example is analyzed to illustrate the application of the proposed methods.

BER Performance of NLOS Underwater Wireless Optical Communication with Multiple Scattering

Recently, there is a lot of interest in the field of under water optical wireless communication for short range because of its high bandwidth. But in most of the previous works line of sight propagation or single scattering of photons only considered. In practical case this is not applicable because of beam blockage in underwater and multiple scattering also occurred during the photons propagation through water. In this paper we consider a non-line of sight underwater wireless optical communication system with multiple scattering and examine the performance of the system using monte carlo simulation. The distribution scattering angle of photons are modeled by Henyey-Greenstein method. The average bit error rate is calculated using on-off keying modulation for different water types.