Influence of Thermal Annealing on The Structural Properties of Vanadyl Phthalocyanine Thin Films: A Comparative Study
This paper presents a comparative study on
Vanadyl Phthalocyanine (VOPc) thin films deposited by thermal
evaporation and spin coating techniques. The samples
were prepared on cleaned glass substrates and annealed at
various temperatures ranging form 95oC to 155oC. To obtain
the morphological and structural properties of VOPc thin
films, X-ray diffraction (XRD) technique and atomic force
microscopy (AFM) have been implied. The AFM topographic
images show a very slight difference in the thermally grown
films, before and after annealing, however best results are
achieved for the spin-cast film annealed at 125oC. The XRD
spectra show no existence of the sharp peaks, suggesting the
material to be amorphous. The humps in the XRD patterns
indicate the presence of some crystallites.
[1] D. Gu, Qiying Chen, Juping Shu, Xiaodong Tang, Fuxi Gan, Shuyin
Shenb, Kai Liu and Huijun Xu, "Optical recording performance of thin
films of phthalocyanine compounds," Thin Solid Films vol. 257 pp. 88-93,
1995.
[2] B. W. Bloom A, US Patent, vol. 4, p. 355, 1980.
[3] S. Shihub and R. Gould, "Structure and phase-change phenomena in
evaporated thin films of cobalt phthalocyanine," physica status solidi (a),
vol. 139, pp. 129-138, 1993.
[4] A. El-Bosaty, et al., "Surface Plasmon-Cobalt Phthalocyanine Sensor for
NO2 gas," Egypt. J. Solids, 2006.
[5] M. Shah, Kh. S. Karimov and M H Sayyad, "Organic semiconductor
nickel phthalocyanine-based photocapacitive and photoresistive detector,"
Semicond. Sci. Technol. , vol. 25, pp. 75014-75018, 2010.
[6] L. Li, Qingxin Tang, Hongxiang Li, Wenping Hu, Xiaodi Yang, Zhigang
Shuai, Yunqi Liu, and Daoben Zhu, "Organic thin-film transistors of
phthalocyanines*," Pure Appl. Chem., vol. 80, pp. 2231-2240, 2008.
[7] Y. D. Kim, Jae Pil Kim, Oh Sang Kwon ands In Hee Cho, "The synthesis
and application of thermally stable dyes for ink-jet printed LCD scolor
filters," Dyes and Pigments, vol. 81 pp. 45-52, 2009.
[8] F. Carpi, D. De Rossi, "Colours from electroactive polymers: Electrochromic,
electroluminescent and laser devices based on organic materials,"
Optics Laser Technology vol. 38 2006.
[9] B. D. Bezerine, Coordination Compounds of Porphyrins and Phthalocyanines.
New York: Wiley, 1981.
[10] W. Li, Yong Pu, Wenqing Fang, Jiangnan Dai, Changda Zheng, Chunlan
Mo, Chuanbin Xiong, Fengyi Jiang, "Effect of high-temperature annealing
on the structural and optical properties of ZnO films," Thin solid
films, vol. 491, pp. 323-327, 2005.
[11] M. M. El-Nahass, Z. El-Gohary, H.S. Soliman, "Structural and optical
studies of thermally evaporated CoPc thin lms," Optics Laser Technology
vol. 35 pp. 523 - 531, 2003.
[12] M. M. a. S. Y. El-Nahass, "Effect of annealing temperature on the optical
properties of thermally evaporated tin phthalocyanine thin films," Applied
Surface Science vol. 255 pp. 1631-1636, 2008.
[13] R. Ye, Mamoru Baba, Koji Ohta and Kazunori Suzuki, "Effects of
thermal annealing on structure, morphology and electrical properties of
F16CuPc/a6T heterojunction thin films," Solid-State Electronics vol. 54
pp. 710-714, 2010.
[14] Y. L. Pan, Y. J. Wu, L. B. Chen, Y. Y. Zhao, Y. Y. Shen, F. M. Li,
S. Y. Shen and D. Y. Huang, "Structure and spectroscopic characterization
polycrystalline vanadyl phthalocyanine (VOPc) films fabricated by
vacuum deposition," Appl. Phys. A, vol. 66, pp. 569-573, 1998.
[15] G. Li, Visha Shrotriya, Yan Yao and Yang Yang, "Investigation of
annealing effects and film thickness dependence of polymer solar cells
based on poly(3-hexylthiophene)," J. Appl. Phys., vol. 98, pp. 043704-1,
2005.
[16] A. M. E. Raj, S. G. Victoria,V. B. Jothy, C. Ravidhas, J. Wollschlager,
M. Suendorf, M. Neumann, M. Jayachandran, C. Sanjeeviraja, "XRD
and XPS caharacterization of mixed valence Mn3O4 hausmannite thin
films prepared by chemical spray pyrolysis technique," Applied Surface
Science, vol. 256, pp. 2920-2926, 2010.
[17] M. Na and S. W. Rhee, "Electronic characterization of Al/PMMA
[poly (methyl methacrylate)]/p-Si and Al/CEP (cyanoethyl pullulan)/p-
Si structures," Organic Electronics, vol. 7, pp. 205-212, 2006.
[1] D. Gu, Qiying Chen, Juping Shu, Xiaodong Tang, Fuxi Gan, Shuyin
Shenb, Kai Liu and Huijun Xu, "Optical recording performance of thin
films of phthalocyanine compounds," Thin Solid Films vol. 257 pp. 88-93,
1995.
[2] B. W. Bloom A, US Patent, vol. 4, p. 355, 1980.
[3] S. Shihub and R. Gould, "Structure and phase-change phenomena in
evaporated thin films of cobalt phthalocyanine," physica status solidi (a),
vol. 139, pp. 129-138, 1993.
[4] A. El-Bosaty, et al., "Surface Plasmon-Cobalt Phthalocyanine Sensor for
NO2 gas," Egypt. J. Solids, 2006.
[5] M. Shah, Kh. S. Karimov and M H Sayyad, "Organic semiconductor
nickel phthalocyanine-based photocapacitive and photoresistive detector,"
Semicond. Sci. Technol. , vol. 25, pp. 75014-75018, 2010.
[6] L. Li, Qingxin Tang, Hongxiang Li, Wenping Hu, Xiaodi Yang, Zhigang
Shuai, Yunqi Liu, and Daoben Zhu, "Organic thin-film transistors of
phthalocyanines*," Pure Appl. Chem., vol. 80, pp. 2231-2240, 2008.
[7] Y. D. Kim, Jae Pil Kim, Oh Sang Kwon ands In Hee Cho, "The synthesis
and application of thermally stable dyes for ink-jet printed LCD scolor
filters," Dyes and Pigments, vol. 81 pp. 45-52, 2009.
[8] F. Carpi, D. De Rossi, "Colours from electroactive polymers: Electrochromic,
electroluminescent and laser devices based on organic materials,"
Optics Laser Technology vol. 38 2006.
[9] B. D. Bezerine, Coordination Compounds of Porphyrins and Phthalocyanines.
New York: Wiley, 1981.
[10] W. Li, Yong Pu, Wenqing Fang, Jiangnan Dai, Changda Zheng, Chunlan
Mo, Chuanbin Xiong, Fengyi Jiang, "Effect of high-temperature annealing
on the structural and optical properties of ZnO films," Thin solid
films, vol. 491, pp. 323-327, 2005.
[11] M. M. El-Nahass, Z. El-Gohary, H.S. Soliman, "Structural and optical
studies of thermally evaporated CoPc thin lms," Optics Laser Technology
vol. 35 pp. 523 - 531, 2003.
[12] M. M. a. S. Y. El-Nahass, "Effect of annealing temperature on the optical
properties of thermally evaporated tin phthalocyanine thin films," Applied
Surface Science vol. 255 pp. 1631-1636, 2008.
[13] R. Ye, Mamoru Baba, Koji Ohta and Kazunori Suzuki, "Effects of
thermal annealing on structure, morphology and electrical properties of
F16CuPc/a6T heterojunction thin films," Solid-State Electronics vol. 54
pp. 710-714, 2010.
[14] Y. L. Pan, Y. J. Wu, L. B. Chen, Y. Y. Zhao, Y. Y. Shen, F. M. Li,
S. Y. Shen and D. Y. Huang, "Structure and spectroscopic characterization
polycrystalline vanadyl phthalocyanine (VOPc) films fabricated by
vacuum deposition," Appl. Phys. A, vol. 66, pp. 569-573, 1998.
[15] G. Li, Visha Shrotriya, Yan Yao and Yang Yang, "Investigation of
annealing effects and film thickness dependence of polymer solar cells
based on poly(3-hexylthiophene)," J. Appl. Phys., vol. 98, pp. 043704-1,
2005.
[16] A. M. E. Raj, S. G. Victoria,V. B. Jothy, C. Ravidhas, J. Wollschlager,
M. Suendorf, M. Neumann, M. Jayachandran, C. Sanjeeviraja, "XRD
and XPS caharacterization of mixed valence Mn3O4 hausmannite thin
films prepared by chemical spray pyrolysis technique," Applied Surface
Science, vol. 256, pp. 2920-2926, 2010.
[17] M. Na and S. W. Rhee, "Electronic characterization of Al/PMMA
[poly (methyl methacrylate)]/p-Si and Al/CEP (cyanoethyl pullulan)/p-
Si structures," Organic Electronics, vol. 7, pp. 205-212, 2006.
@article{"International Journal of Chemical, Materials and Biomolecular Sciences:50919", author = "Fakhra Aziz and K. Sulaiman and M. R. Muhammad and M. Hassan Sayyad and Kh. Karimov", title = "Influence of Thermal Annealing on The Structural Properties of Vanadyl Phthalocyanine Thin Films: A Comparative Study", abstract = "This paper presents a comparative study on
Vanadyl Phthalocyanine (VOPc) thin films deposited by thermal
evaporation and spin coating techniques. The samples
were prepared on cleaned glass substrates and annealed at
various temperatures ranging form 95oC to 155oC. To obtain
the morphological and structural properties of VOPc thin
films, X-ray diffraction (XRD) technique and atomic force
microscopy (AFM) have been implied. The AFM topographic
images show a very slight difference in the thermally grown
films, before and after annealing, however best results are
achieved for the spin-cast film annealed at 125oC. The XRD
spectra show no existence of the sharp peaks, suggesting the
material to be amorphous. The humps in the XRD patterns
indicate the presence of some crystallites.", keywords = "Annealing, optical properties, thin films, Vanadylphthalocyanine.", volume = "5", number = "8", pages = "671-3", }
